Particles on Surfaces 2: Detection, Adhesion, and Removal (NATO Asi Series B: Physics; 207) - Hardcover

 
9780306433672: Particles on Surfaces 2: Detection, Adhesion, and Removal (NATO Asi Series B: Physics; 207)

Synopsis

This volume documents the proceedings of the Second Symposium on Particles on Surfaces: Detection, Adhesion and Removal held as part of the 19th Annual Meeting of the Fine Particle Society in Santa Clara, California, July 20-25, 1988. The premier symposium on this topic was l organized in 1986 and has been properly chronicled . Based on the success of these two events and the high interest evinced by the technical community, we plan to regularly hold symposia on this topic on a biennial basis and the next one is slated for August 20-24, 1990 in San Diego, California. l As pointed out in the Preface to the first volume , the topic of particles on surfaces is of paramount importance in legion of technological areas. Particularly in the semiconductor device fabrication area, all signals indicate that the understanding of the behavior of particles on surfaces and their removal will attain heightened importance in the times to come. As the device dimensions are shrinking at an accelerated pace, so the benign particles of today will become the killer defects in the not too distant future. The tempo of research and development activity in the field of particles on surfaces is very high, and better and novel ways are continuously being devised to remove smaller and smaller particles.

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Synopsis

Twenty-five papers (peer-reviewed and substantially revised) from the symposium held July 1988, as part of the annual meeting of the Fine Particle Society. The topic is of paramount importance in many technological areas, particularly semiconductor device fabrication. The papers cover particle-substrate interaction, deposition and adhesion; particl

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9781461278528: Particles on Surfaces 2: Detection, Adhesion, and Removal

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ISBN 10:  146127852X ISBN 13:  9781461278528
Publisher: Springer, 2011
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