Defect and Fault Tolerance in Vlsi Systems: Volume 1 (Defect and Fault Tolerance in VLSI Systems: International Workshop Proceedings) - Hardcover

Koren, Israel

Hardcover

ISBN 10: 0306432242 ISBN 13: 9780306432248

Publisher: Kluwer Academic / Plenum Publishers, 1989

Synopsis

This book contains an edited selection of papers presented at the International Workshop on Defect and Fault Tolerance in VLSI Systems held October 6-7, 1988 in Springfield, Massachusetts. Our thanks go to all the contributors and especially the members of the program committee for the difficult and time-consuming work involved in selecting the papers that were presented in the workshop and reviewing the papers included in this book. Thanks are also due to the IEEE Computer Society (in particular, the Technical Committee on Fault-Tolerant Computing and the Technical Committee on VLSI) and the University of Massachusetts at Amherst for sponsoring the workshop, and to the National Science Foundation for supporting (under grant number MIP-8803418) the keynote address and the distribution of this book to all workshop attendees. The objective of the workshop was to bring t. ogether researchers and practition- ers from both industry and academia in the field of defect tolerance and yield en- ha. ncement in VLSI to discuss their mutual interests in defect-tolerant architectures and models for integrated circuit defects, faults, and yield. Progress in this area was slowed down by the proprietary nature of yield-related data, and by the lack of appropriate forums for disseminating such information. The goal of this workshop was therefore to provide a forum for a dialogue and exchange of views. A follow-up workshop in October 1989, with C. H. Stapper from IBM and V. K. Jain from the University of South Florida as general co-chairmen, is being organized.

About this title

Synopsis

Contains a selection of papers presented at an international workshop on [title] held Oct. 1988 in Springfield, Mass. Here, both researchers and practitioners in the field discuss their mutual interests in defect-tolerant architectures and models for integrated circuit defects, faults, and yield. Annotation copyright Book News, Inc. Portland, Or.

Edition details

• Publisher: Kluwer Academic / Plenum Publishers
• Publication date: 1989
• ISBN 10: 0306432242
• ISBN 13: 9780306432248
• Binding: Hardcover
• Language: English
• Number of pages: 374