Structure and Properties of Polymer Films: 001 (Polymer Science and Technology, V. 1) - Hardcover

Borden Award Symposium In Honor Of Richard S. Stein Boston 1972; American Chemical Society. Division Of Organic Coatings And Plastics Chemistry

Hardcover

ISBN 10: 0306364018 ISBN 13: 9780306364013

Publisher: Plenum Pub Corp, 1973

Synopsis

The study of the relationship between the structure, morphology and properties of polymer films has significantly progressed in recent years through the use of a number of phyiscal techniques - some new and some old. These methods include small and large angle x-ray diffraction, bire­ fringence, light scattering, infrared dichroism, fluorescence polarization, light and electron microscopy and interferrometry. This collection of papers, most of which were presented at a symposium at the Boston American Chemical Society Meeting in April, 1972, represent a collection of recent studies using many of these methods by some of the leading scientists in their fields. It is evident that these various techniques permit the study of various aspects of film structure such as crystal structure and orientation, amorphous orientation, the interrelation of crystalline and amorphous regions in lamellar, fibrillar, and spherulitic superstructure and the relationshi. p of these structural variables to the mechanical and optical properties of the films. Film structure is sufficiently complex that a complete understanding of the relationship between structure and properties will come from the employment of a combination of several of these methods. vii CONTENTS Optical Studies of the Morphology of Polymer Films 1 Richard S. Stein Light Scattering by Oriented Native Cellulose Systems 25 R. H. Marchessault Superstructure in Films of Bio and Biorelated Small Angle Polymers as Noted by 39 Light Scattering Garth L.

Edition details

• Publisher: Plenum Pub Corp
• Publication date: 1973
• Language: English
• ISBN 10: 0306364018
• ISBN 13: 9780306364013
• Binding: Hardcover
• Number of pages: 345
• Editor: Lenz Robert W., Stein Richard S.