Carrier Lifetime Measurement by the Photoconductive Decay Method (Classic Reprint) - Hardcover

Name: Carrier Lifetime Measurement by the Photoconductive Decay Method (Classic Reprint)
Author: Richard L. Mattis
ISBN: 9780265939604

Richard L. Mattis

9780265939604: Carrier Lifetime Measurement by the Photoconductive Decay Method (Classic Reprint)

Hardcover

ISBN 10: 0265939607 ISBN 13: 9780265939604

Publisher: Forgotten Books, 2018

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Excerpt from Carrier Lifetime Measurement by the Photoconductive Decay Method

The authors are indebted to many people at nbs for assistance in carrying out this research. W. E. Phillips and W. M. Bullis provided helpful suggestions throughout the course of the work. The lifetime versus temperature data were taken by F. R. Kelly. The specimen temper ature versus specimen current data were taken by F1 H. Brewer. Fabrica tion assistance was provided by A. W. Stallings. The manuscript was typed at various stages by T. A. Schultz, R. E. Joel, M. L. Stream, and K. E. Dodson.

The authors are also indebted to Dr. H. Benda for supplying a pre print of his publication which is referenced herein.

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