Items related to Logic Testing and Design for Testability (Computer...
Synopsis
Logic Testing and Design for Testability Design for testability techniques offer one approach toward alleviating this situation by adding enough extra circuitry to a circuit or chip to reduce the complexity of testing. Full description
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About the Author
Hideo Fujiwara is an associate professor in the Department of Electronics and Communication, Meiji University.
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- PublisherMIT Press
- Publication date1985
- ISBN 10 0262561999
- ISBN 13 9780262561990
- BindingPaperback
- LanguageEnglish
- Number of pages298
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Logic Testing and Design for Testability
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Logic Testing and Design for Testability (Paperback or Softback)
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MIT Press 7/31/1985, 1985
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Logic Testing and Design for Testability
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