Items related to Principles of Materials Characterization and Metrology

Principles of Materials Characterization and Metrology - Hardcover

Krishnan, Kannan M.

 
9780198830252: Principles of Materials Characterization and Metrology

Synopsis

This book provides a comprehensive introduction to the principles of materials characterization and metrology.

"synopsis" may belong to another edition of this title.

About the Author

Kannan M. Krishnan graduated from the Indian Institute of Technology, Kanpur and earned his Ph.D. from University of California, Berkeley (UCB) in 1984. He is currently Professor of Materials Sciences and Physics at the University of Washington (UW). He is a Fellow of the American Physical Society, the Institute of Physics (London), the American Association for the Advancement of Science, and the Institute of Electrical and Electronics Engineers (IEEE). He has received the Burton Medal (MSA), the Fink Prize (IEEE), the Guggenheim and Rockefeller fellowships, a Fulbright Specialist award, the Distinguished Engineer/Scientist award (TMS) and the Alexander von Humboldt Research Award, and has been elected a member of the Washington State Academy of Sciences. With visiting appointments at institutions in all six continents and multiple teaching awards at UCB, UW and professional societies (IEEE Magnetics Distinguished Lectureship), he is widely recognized for his role in education.

"About this title" may belong to another edition of this title.

Other Popular Editions of the Same Title

9780198830269: Principles of Materials Characterization and Metrology

Featured Edition

ISBN 10:  0198830262 ISBN 13:  9780198830269
Publisher: OUP Oxford, 2021
Softcover