Measurement of high-speed signals in solid state devices. Semiconductors and Semimetals Volume 28, hardcover, xv, 438 p. : ill. Good Clean Copy
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Operating speeds near 1 ps and dimensions well below 1 micron dictate the need for non-invasive probes. This book discusses the current status of methods developed to perform such measurements. Most of the techniques are "contactless" and most make use of sampling methods requiring synchronization and signal averaging to obtain a satisfactory signa
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Seller: True Oak Books, Highland, NY, U.S.A.
Hardcover. Condition: Good. Dust Jacket Condition: No Dust Jacket. First Edition; First Printing. Semiconductors And Semimetals, Vol. 28; 438 pages; Ex-Library copy with usual identifiers. Many graphs. Light foxing on the top exterior edge of textblock. Good condition otherwise. No other noteworthy defects. No markings on text pages.; - Your satisfaction is our priority. We offer free returns and respond promptly to all inquiries. Your item will be carefully cushioned in bubble wrap and securely boxed. All orders ship on the same or next business day. Buy with confidence. Seller Inventory # HVD-81538-A-0