With VLSI chip transistors getting smaller and smaller, today's digital systems are more complex than ever before. This increased complexity leads to more cross-talk, noise, and other sources of transient errors during normal operation. Traditional off-line testing strategies cannot guarantee detection of these transient faults. And with critical applications relying on faster, more powerful chips, fault-tolerant, self-checking mechanisms must be built in to assure reliable operation. "Self-Checking and Fault-Tolerant Digital Design" deals extensively with self-checking design techniques and is the only book that emphasizes major techniques for hardware fault tolerance. Graduate students in VLSI design courses as well as practicing designers will appreciate this balanced treatment of the concepts and theory underlying fault tolerance along with the practical techniques used to create fault-tolerant systems. It introduces reliability theory and the importance of maintainability. It presents coding and the construction of several error detecting and correcting codes. It discusses in depth, the available techniques for fail-safe design of combinational circuits. It details checker design techniques for detecting erroneous bits and encoding output of self-checking circuits. It demonstrates how to design self-checking sequential circuits, including a technique for fail-safe state machine design.
"synopsis" may belong to another edition of this title.
The author is currently a Professor in the Department of Electrical Engineering at North Carolina A&T State University. He is the author of more than 75 papers, and three books published by Prentice Hall. His research interests include design for testability, self-checking logic design, automatic logic synthesis of low power logic circuits, andCPLD/FPGA based system design. He received a M.S. from King's College, London, and a Ph.D. from the City University of London.
"About this title" may belong to another edition of this title.
Book Description Book Condition: New. Gift Quality Book in Excellent Condition. Bookseller Inventory # 36S9KG0008RT
Book Description Morgan Kaufmann, 2000. Book Condition: New. Brand New, Unread Copy in Perfect Condition. A+ Customer Service! Summary: Chapter 1 - Fundamentals of Reliability Chapter 2 - Error Detecting and Correcting Codes Chapter 3 - Self-Checking Combinational Logic Design Chapter 4 - Self-Checking Checkers Chapter 5 - Self-Checking Sequential Circuit Design Chapter 6 - Fault-Tolerant Design Appendix Markov Models. Bookseller Inventory # ABE_book_new_0124343708
Book Description Book Condition: Brand New. Brand New Original US Edition, Perfect Condition. Printed in English. Excellent Quality, Service and customer satisfaction guaranteed!. Bookseller Inventory # AIND-1187
Book Description Book Condition: New. New. US edition. Perfect condition. Ship by express service to USA, Canada, Australia, France, Italy, UK, Germany and Netherland. Customer satisfaction our priority. Bookseller Inventory # ABE-190516-6113
Book Description Book Condition: Brand New. New. US edition. Customer Satisfaction guaranteed!!. Bookseller Inventory # SHAK6113
Book Description Book Condition: New. Brand New Original US Edition.We Ship to PO BOX Address also. EXPEDITED shipping option also available for faster delivery. Bookseller Inventory # AUSBNEW-1187
Book Description Morgan Kaufmann, 2000. Hardcover. Book Condition: New. book. Bookseller Inventory # 0124343708
Book Description Morgan Kaufmann, 2000. Hardcover. Book Condition: New. 1. Bookseller Inventory # DADAX0124343708
Book Description Elsevier. Book Condition: New. pp. xii + 216 , Figures This item is printed on Demand. Bookseller Inventory # 7685376
Book Description Morgan Kaufmann. Hardcover. Book Condition: New. 0124343708 New Condition. Bookseller Inventory # NEW6.0041555