Synopsis
Foundations of Measurement offers the most coherently organized treatment of the topics and issues central to measurement. Much of the research involved has been scattered over several decades and a multitude of journals--available in many instances only to specialties. With the publication of Volumes two and three of this important work, Foundations of Measurement is the most comprehensive presentation in the area of measurement.
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About the Author
David H. Krantz is affiliated with Columbia University; R. Duncan Luce with the University of California, Irvine, and Patrick Suppes with Stanford University. Amos Tversky is deceased.
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Foundations of Measurement: Volume 2
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Condition: Gut. Zustand: Gut | Sprache: Englisch | Produktart: Bücher. Seller Inventory # 42872552/203
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Foundations of Measurement, Vol. 2: Geometrical, Threshold and Probabilistic Representations
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