Advances in Imaging and Electron Physics: Part A: Volume 172 - Hardcover

Book 47 of 77: ISSN

Cremer, Ted

 
9780123944221: Advances in Imaging and Electron Physics: Part A: Volume 172

Synopsis

This special volume of Advances in Imaging and Electron Physics details the current theory, experiments, and applications of neutron and x-ray optics and microscopy for an international readership across varying backgrounds and disciplines. Edited by Dr. Ted Cremer, these volumes attempt to provide rapid assimilation of the presented topics that include neutron and x-ray scatter, refraction, diffraction, and reflection and their potential application.

  • Contributions from leading authorities
  • Informs and updates on all the latest developments in the field

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Review

Advances in Imaging and Electron Physics features cutting-edge articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains

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