Published by Südwestdeutscher Verlag für Hochschulschriften, 2009
ISBN 10: 3838107926 ISBN 13: 9783838107929
Seller: PBShop.store UK, Fairford, GLOS, United Kingdom
PAP. Condition: New. New Book. Delivered from our UK warehouse in 4 to 14 business days. THIS BOOK IS PRINTED ON DEMAND. Established seller since 2000.
Published by Südwestdeutscher Verlag für Hochschulschriften, 2009
ISBN 10: 3838107926 ISBN 13: 9783838107929
Seller: Lucky's Textbooks, Dallas, TX, U.S.A.
Condition: New.
Published by Südwestdeutscher Verlag Für Hochschulschriften Jun 2009, 2009
ISBN 10: 3838107926 ISBN 13: 9783838107929
Seller: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, Germany
Taschenbuch. Condition: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -Synchrotron radiation induced Total reflection X-Ray Fluorescence (SR-TXRF) analysis is a micro-analytical technique which offers detection limits in the femtogram range for most elements. The technique can be coupled with X-ray Absorption Near Edge Structure (XANES) spectroscopy to gain information on the chemical environment of specific elements of interest at an ultra trace level. The combination of these techniques has been applied to various analytical problems arising from industrial applications and environmental research. In this work self absorption effects were observed for sample amounts above several nanograms. The influence of these effects on TXRF-XANES analysis was investigated by comparing grazing incidence and grazing exit (inverse geometry) setups and simulations, showing that these self absorption effects occur due to the special grazing incidence geometry. In the framework of this thesis the author exploited the strengths and pitfalls of the combination of TXRF and XANES analysis and demonstrated the power of this multifunctional method to perform chemical speciation studies at trace element levels. 176 pp. Deutsch.
Published by Südwestdeutscher Verlag für Hochschulschriften, 2009
ISBN 10: 3838107926 ISBN 13: 9783838107929
Seller: Ria Christie Collections, Uxbridge, United Kingdom
Condition: New. PRINT ON DEMAND Book; New; Fast Shipping from the UK. No. book.
Published by Sudwestdeutscher Verlag fur Hochschulschrifte 2009-08, 2009
ISBN 10: 3838107926 ISBN 13: 9783838107929
Seller: Chiron Media, Wallingford, United Kingdom
PF. Condition: New.
Published by Südwestdeutscher Verlag für Hochschulschriften, 2009
ISBN 10: 3838107926 ISBN 13: 9783838107929
Seller: PBShop.store US, Wood Dale, IL, U.S.A.
PAP. Condition: New. New Book. Shipped from UK. THIS BOOK IS PRINTED ON DEMAND. Established seller since 2000.
Published by Südwestdeutscher Verlag Für Hochschulschriften, 2009
ISBN 10: 3838107926 ISBN 13: 9783838107929
Seller: AHA-BUCH GmbH, Einbeck, Germany
Taschenbuch. Condition: Neu. nach der Bestellung gedruckt Neuware - Printed after ordering - Synchrotron radiation induced Total reflection X-Ray Fluorescence (SR-TXRF) analysis is a micro-analytical technique which offers detection limits in the femtogram range for most elements. The technique can be coupled with X-ray Absorption Near Edge Structure (XANES) spectroscopy to gain information on the chemical environment of specific elements of interest at an ultra trace level. The combination of these techniques has been applied to various analytical problems arising from industrial applications and environmental research. In this work self absorption effects were observed for sample amounts above several nanograms. The influence of these effects on TXRF-XANES analysis was investigated by comparing grazing incidence and grazing exit (inverse geometry) setups and simulations, showing that these self absorption effects occur due to the special grazing incidence geometry. In the framework of this thesis the author exploited the strengths and pitfalls of the combination of TXRF and XANES analysis and demonstrated the power of this multifunctional method to perform chemical speciation studies at trace element levels.
Published by Südwestdeutscher Verlag für Hochschulschriften, 2009
ISBN 10: 3838107926 ISBN 13: 9783838107929
Seller: moluna, Greven, Germany
Condition: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Synchrotron radiation induced Total reflection X-Ray Fluorescence (SR-TXRF) analysis is a micro-analytical technique which offers detection limits in the femtogram range for most elements. The technique can be coupled with X-ray Absorption Near Edge Structu.
Published by Südwestdeutscher Verlag für Hochschulschriften, 2009
ISBN 10: 3838107926 ISBN 13: 9783838107929
Seller: Mispah books, Redhill, SURRE, United Kingdom
Paperback. Condition: Like New. Like New. book.