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CMOS SRAM: CIRCUIT DESIGN AND PARAMETRIC TEST IN NANO-SCALED TECHNOLOGIES (PROCESS-AWARE SRAM DESIGN AND TEST) - Softcover

 
9788132202325: CMOS SRAM: CIRCUIT DESIGN AND PARAMETRIC TEST IN NANO-SCALED TECHNOLOGIES (PROCESS-AWARE SRAM DESIGN AND TEST)
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Cmos Sram: Circuit Design And Parametric Test In Nano-Scaled Technologies (Process-Aware Sram Design And Test) by Pavlov, Springer India, 2011, Hardcover, 9788132202325

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  • ISBN 10 8132202325
  • ISBN 13 9788132202325
  • BindingPaperback

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9781402083624: CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies: Process-Aware SRAM Design and Test: 40 (Frontiers in Electronic Testing, 40)

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ISBN 10:  1402083629 ISBN 13:  9781402083624
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  • 9789048178551: CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies: Process-Aware SRAM Design and Test: 40 (Frontiers in Electronic Testing, 40)

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  • 9789048117451: CMOS Sram Circuit Design and Parametric Test in Nano-Scaled Technologies

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Pavlov Andrei
Published by Springer Nature (Sie) (2011)
ISBN 10: 8132202325 ISBN 13: 9788132202325
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