Items related to Optical Metrology
Optical metrology, or the use of optical techniques for measurement, has progressed rapidly in recent years. Modern sources of radiation, modulators, beam scanners, photo detectors and the computer-assisted detection and display of information have all contributed to the growing interest in the application of optical technology for the solution of a wide variety of measurement problems. This self-contained introduction to the field covers both fundamental theory and practical applications.
"synopsis" may belong to another edition of this title.
From the Back Cover:
Recent advances in optical devices and computer technology have enabled the development of new optical systems and techniques for measurement. Providing practical guidance for readers with a minimal background in optics, the third edition of this classic book explores the latest optical metrology technologies, from digital holography and digital speckle photography to fibre Bragg sensors and optical coherence tomography.
Features include:
* A chapter on computerised optical processes such as electronic speckle interferometry, digital holography and digital speckle photography.
* Sections introducing optical sources and detectors, including diode lasers, light emitting diodes and photoelectric detectors and the CCD camera.
* Coverage of digital fringe pattern measurement techniques with special emphasis on phase measurement interferometry and phase unwrapping.
* Detailed discussion on lasers and laser principles, including an introduction to radiometry and photometry.
* A revised chapter on digital image processing, including noise suppression, edge- and fringe detection with sub-pixel accuracy, the DFT and the FFT.
* End-of-chapter problems and solutions.
This holistic treatment provides students and professionals in the field of optical and communications engineering with an accessible and self-contained guide to all of the main optical metrology techniques in use today.
Features include:
* A chapter on computerised optical processes such as electronic speckle interferometry, digital holography and digital speckle photography.
* Sections introducing optical sources and detectors, including diode lasers, light emitting diodes and photoelectric detectors and the CCD camera.
* Coverage of digital fringe pattern measurement techniques with special emphasis on phase measurement interferometry and phase unwrapping.
* Detailed discussion on lasers and laser principles, including an introduction to radiometry and photometry.
* A revised chapter on digital image processing, including noise suppression, edge- and fringe detection with sub-pixel accuracy, the DFT and the FFT.
* End-of-chapter problems and solutions.
This holistic treatment provides students and professionals in the field of optical and communications engineering with an accessible and self-contained guide to all of the main optical metrology techniques in use today.
"About this title" may belong to another edition of this title.
- PublisherWiley–Blackwell
- Publication date1995
- ISBN 10 0471954748
- ISBN 13 9780471954743
- BindingHardcover
- Edition number2
- Number of pages332
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Optical Metrology
Published by
John Wiley and Sons
(1995)
ISBN 10: 0471954748
ISBN 13: 9780471954743
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Hardcover
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Book Description Condition: Good. This is an ex-library book and may have the usual library/used-book markings inside.This book has hardback covers. In good all round condition. Please note the Image in this listing is a stock photo and may not match the covers of the actual item,850grams, ISBN:9780471954743. Seller Inventory # 9952425
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Optical Metrology
Published by
John Wiley & Sons Ltd 01.07.1996.
(1996)
ISBN 10: 0471954748
ISBN 13: 9780471954743
Used
Hardcover
Quantity: 1
Seller:
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Book Description Condition: Gut. Auflage: Subsequent. 300 Seiten Mit altersbedingten Lager- und Gebrauchsspuren. Bibliotheksex. E-K217 Sprache: Englisch Gewicht in Gramm: 734 17,3 x 2,6 x 25,0 cm, Gebundene Ausgabe. Seller Inventory # 124027
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