Optical Metrology, 3rd Edition (Electrical & Electronics Engr) - Hardcover

Kjell J. Gasvik

Hardcover

ISBN 10: 0470843004 ISBN 13: 9780470843000

Publisher: John Wiley and Sons Ltd, 2002

Synopsis

This is a new material on computerized optical processes, computerized ray tracing, and the fast Fourier transform, Bibre-Bragg sensors, and temporal phase unwrapping. It features new introductory sections to all chapters. It includes detailed discussion on lasers and laser principles, including an introduction to radiometry and photometry. It includes thorough coverage of the CCD camera. It also features End-of-chapter problems.

About this title

Product Description:

Presents a material on computerized optical processes, computerized ray tracing, and the Fourier transform, Bibre-Bragg sensors, and temporal phase unwrapping. This book provides discussion on lasers and laser principles, including an introduction to radiometry and photometry. It offers coverage of the CCD camera.

From the Back Cover:

Recent advances in optical devices and computer technology have enabled the development of new optical systems and techniques for measurement. Providing practical guidance for readers with a minimal background in optics, the third edition of this classic book explores the latest optical metrology technologies, from digital holography and digital speckle photography to fibre Bragg sensors and optical coherence tomography.

Features include:

• A chapter on computerised optical processes such as electronic speckle interferometry, digital holography and digital speckle photography.
• Sections introducing optical sources and detectors, including diode lasers, light emitting diodes and photoelectric detectors and the CCD camera.
• Coverage of digital fringe pattern measurement techniques with special emphasis on phase measurement interferometry and phase unwrapping.
• Detailed discussion on lasers and laser principles, including an introduction to radiometry and photometry.
• A revised chapter on digital image processing, including noise suppression, edge- and fringe detection with sub-pixel accuracy, the DFT and the FFT.
• End-of-chapter problems and solutions.

This holistic treatment provides students and professionals in the field of optical and communications engineering with an accessible and self-contained guide to all of the main optical metrology techniques in use today.

About this edition

• Publisher: John Wiley and Sons Ltd
• Publication date: 2002
• ISBN 10: 0470843004
• ISBN 13: 9780470843000
• Binding: Hardcover
• Number of pages: 372