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From China to U.S.A.
Seller: liu xing, Nanjing JiangSu, JS, China
paperback. Condition: New. Paperback. Pub Date: June 2007 Pages: 212 in Publisher: Machinery Industry Press microwave RF measurement technology necessary technology to verify the design of microwave RF device performance and testing theory is the basis of the computer-aided design of microwave circuits technology. with the communication electronics the rapid development of technology. domestic and foreign demand Microwave RF measurement technology and talent is increasingly urgent. the microwave RF measurements gradual. Seller Inventory # CB009712
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