Book Description Soft Cover. Condition: new. This item is printed on demand. Seller Inventory # 9783540133599
Book Description Condition: New. Seller Inventory # ABLIING23Mar3113020160172
Book Description Condition: New. PRINT ON DEMAND Book; New; Fast Shipping from the UK. No. book. Seller Inventory # ria9783540133599_lsuk
Book Description Condition: New. pp. 196. Seller Inventory # 26101484425
Book Description Paperback. Condition: Brand New. spiral-bound edition. 192 pages. 9.26x6.11x0.45 inches. In Stock. Seller Inventory # x-3540133593
Book Description Condition: New. Print on Demand pp. 196 49:B&W 6.14 x 9.21 in or 234 x 156 mm (Royal 8vo) Perfect Bound on White w/Gloss Lam. Seller Inventory # 108738646
Book Description Taschenbuch. Condition: Neu. Druck auf Anfrage Neuware - Printed after ordering - InhaltsangabeA brief background of the present requirement for structural characterization of disordered materials.- Fundamental relationships between rdf and scattering intensity.- Definition of partial structure factors and compositional short range order (CSRO).- Experimental determination of partial structural functions.- Nature of anomalous x-ray scattering and its application for structural analysis of disordered materials.- Theoretical aspects on the anomalous dispersion factors of x-rays.- Experimental determination of the anomalous dispersion factors.- Selected examples of structural determination using anomalous (resonance) x-ray scattering.- Relative merits of anomalous x-ray scattering and its future prospects. Seller Inventory # 9783540133599
Book Description Condition: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. A brief background of the present requirement for structural characterization of disordered materials.- Fundamental relationships between rdf and scattering intensity.- Definition of partial structure factors and compositional short range order (CSRO).- Exp. Seller Inventory # 4882167
Book Description PF. Condition: New. Seller Inventory # 6666-IUK-9783540133599
Book Description Taschenbuch. Condition: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -InhaltsangabeA brief background of the present requirement for structural characterization of disordered materials.- Fundamental relationships between rdf and scattering intensity.- Definition of partial structure factors and compositional short range order (CSRO).- Experimental determination of partial structural functions.- Nature of anomalous x-ray scattering and its application for structural analysis of disordered materials.- Theoretical aspects on the anomalous dispersion factors of x-rays.- Experimental determination of the anomalous dispersion factors.- Selected examples of structural determination using anomalous (resonance) x-ray scattering.- Relative merits of anomalous x-ray scattering and its future prospects. 196 pp. Englisch. Seller Inventory # 9783540133599