Items related to RF and Time-domain Techniques for Evaluating Novel...
- PublisherSpringer
- Publication date2022
- ISBN 10 3030777774
- ISBN 13 9783030777777
- BindingPaperback
- Edition number1
- Number of pages179
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RF and Time-domain Techniques for Evaluating Novel Semiconductor Transistors by Jenkins, Keith A. [Paperback ]
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RF and Time-Domain Techniques for Evaluating Novel Semiconductor Transistors
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RF and Time-domain Techniques for Evaluating Novel Semiconductor Transistors
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RF and Time-domain Techniques for Evaluating Novel Semiconductor Transistors
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RF and Time-Domain Techniques for Evaluating Novel Semiconductor Transistors
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RF and Time-Domain Techniques for Evaluating Novel Semiconductor Transistors
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RF and Time-domain Techniques for Evaluating Novel Semiconductor Transistors
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RF and Time-domain Techniques for Evaluating Novel Semiconductor Transistors
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RF and Time-domain Techniques for Evaluating Novel Semiconductor Transistors
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Springer International Publishing Dez 2022, 2022
ISBN 10: 3030777774
ISBN 13: 9783030777777
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Taschenbuch
Seller: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, Germany
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Taschenbuch. Condition: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -This book presents a variety of techniques using high-frequency (RF) and time-domain measurements to understand the electrical performance of novel, modern transistors made of materials such as graphene, carbon nanotubes, and silicon-on-insulator, and using new transistor structures. The author explains how to use conventional RF and time- domain measurements to characterize the performance of the transistors. In addition, he explains how novel transistors may be subject to effects such as self-heating, period-dependent output, non-linearity, susceptibility to short-term degradation, DC-invisible structural defects, and a different response to DC and transient inputs. Readers will understand that in order to fully understand and characterize the behavior of a novel transistor, there is an arsenal of dynamic techniques available. In addition to abstract concepts, the reader will learn of practical tips required to achieve meaningful measurements, and will understandthe relationship between these measurements and traditional, conventional DC characteristics. 180 pp. Englisch. Seller Inventory # 9783030777777
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RF and Time-domain Techniques for Evaluating Novel Semiconductor Transistors
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