Symposium OO, 'In Situ Characterization of Dynamic Processes during Materials Synthesis and Transformation'; Symposium PP, 'Advances in Scanning Probe Microscopy for Multimodal Imaging at the Nanoscale'; Symposium QQ, 'Advances in Nanoscale Subsurface, Chemical and Time-Resolved Studies of Soft Matter'; and Symposium TT, 'Advanced Materials Exploration with Neutrons and X-Rays - The State-of-the-Art in the International Year of Crystallography', were held from 30th November-5th December at the 2014 MRS Fall Meeting in Boston, Massachusetts. The papers have been organized to convey advances in the in situ characterization of dynamic processes, scanning probe microscopy for multimodal imaging at the nanoscale, and X-rays for material science. Manuscripts in this volume explore various aspects of the most recent developments in metrology and characterization of materials at the most fundamental level, with spatial resolution down to the nanometer range.
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