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Physical Principles of Electron Microscopy: An Introduction to TEM, SEM, and AEM - Hardcover

 
9780387258003: Physical Principles of Electron Microscopy: An Introduction to TEM, SEM, and AEM
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Scanning and stationary-beam electron microscopes are indispensable tools for both research and routine evaluation in materials science, the semiconductor industry, nanotechnology and the biological, forensic, and medical sciences. This book introduces current theory and practice of electron microscopy, primarily for undergraduates who need to understand how the principles of physics apply in an area of technology that has contributed greatly to our understanding of life processes and "inner space." Physical Principles of Electron Microscopy will appeal to technologists who use electron microscopes and to graduate students, university teachers and researchers who need a concise reference on the basic principles of microscopy.

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"This book comprises a concise introduction to the fundamental physical concepts of electron microscopy and related analytical techniques ... . The concepts are well explained and illustrated, and in addition, the author offers a helpful introduction to microscopy, as a whole ... . The text includes interesting historical tidbits and also alludes to more recent developments ... . It is suitable for institutional or personal purchase." (Andreas Holzenburg, Microbiology Today, July, 2006)

"R.F. Egerton ... has now written a short book for beginners on electron microscopy in general: Physical Principles of Electron Microscopy, an Introduction to TEM, SEM, and AEM[10]. ... Extremely simple language is used throughout and newcomers to the subject will be grateful for this text, designed to accompany a one-semester undergraduate course." (P. W. Hawkes, Ultramicroscopy, Vol. 107 (54), 2007)

Synopsis:
Scanning and stationary-beam electron microscopes have become an indispensable tool for both research and routine evaluation in materials science, the semiconductor industry, nanotechnology and the biological, forensic, and medical sciences. This book provides an introduction to the theory and current practice of electron microscopy, aimed primarily at undergraduates who need to learn how the basic principles of physics are applied in an important area of science and technology that has contributed greatly to our knowledge of life processes and 'inner space'. However, it will be equally valuable for technologists who make use of electron microscopes and for graduate students, university teachers and researchers who need a concise text that deals with the basic principles of microscopy. Less technical but broader in scope than other microscopy textbooks, "Physical Principles of Electron Microscopy" is appropriate for undergraduates and technologists with limited mathematical training.

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  • PublisherSpringer
  • Publication date2005
  • ISBN 10 0387258000
  • ISBN 13 9780387258003
  • BindingHardcover
  • Edition number1
  • Number of pages214
  • Rating

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9783319398761: Physical Principles of Electron Microscopy: An Introduction to TEM, SEM, and AEM

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