Analog and Mixed-Signal Test

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9780137863105: Analog and Mixed-Signal Test

78631-9 The comprehensive guide to analog and mixed-signal IC testing. Increasingly, ICs contain both analog and digital circuitry, making the testing process extremely challenging. This comprehensive guide reviews all the potential testing options for analog and mixed-signal ICs, enabling designers, engineers, CAD developers and researchers to choose the most cost-effective, accurate solution. It outlines the state-of-the-art in analog testing, and covers both major alternatives in-depth: specification-based test and fault model-based test. *Includes contributions from leading researchers worldwide *Provides comprehensive references for further research *Fault modeling, fault simulation and test generation techniques *Extensive coverage of design-for-test techniques *Best methods for spectral-based built-in self test Understand which digital testing techniques and algorithms are applicable to analog and mixed-signal circuitry, and which must be modified. Review fault modeling in detail, especially inductive fault analysis. Learn how to implement the 1194.4 Standard Mixed-Signal Test Bus, understanding its test functions, capabilities, potential benefits and costs.Finally, take a careful look at the testing and design issues associated with CMOS switched-current circuits. Analog and Mixed-Signal Test is the essential tutorial and reference for all electrical engineers designing or testing circuits and devices with analog components.

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From the Inside Flap:

Preface

There has been a dramatic rise in interest in analog and mixed-signal IC test in the recent past. The increased interest has been motivated by economic factors and advances in technology. Characterizing recent activity as an "explosion of interest" would not be misleading. This book is intended to be a single source reference for recent activity in this area. To meet the needs of its intended audience this book offers several features:
A diverse range of topics covering all aspects of analog and mixed-signal IC test ranging from fault modeling through built-in self-test are reviewed.
In addition to reviewing current research, each chapter discusses the advantages and limitations of each potential test solution.
Virtually every chapter contains applications of test techniques to circuits of practical interest to designers.
A comprehensive list of references, up to date as of December 1997, are included in each chapter.
The contributors are distinguished researchers from academe and industry.

This book should be useful to both practitioners and researchers. Commercial circuit designers, test engineers and CAD developers will be able to use the book as a guide to what is available in terms of test solutions. Researchers in the area of design and test can use it as a starting point for their efforts. Most topics have been covered in great detail, with many illustrative examples. The breadth of and the level of detail in the coverage should also permit the material in this book to be used as a textbook for an advanced graduate course on testing.

Chapter 1 outlines current research in analog test and discusses the two significant approaches: specification-based test and fault model based test. The contents of the book are discussed in more detail, and the terminology used is established in this chapter. The chapter examines the applicability of digital test methods to analog circuits and the impact of differences between digital and analog circuits on test techniques and algorithms.

Chapter 2 reviews work in the area of fault modeling. The review focuses on inductive fault analysis. The coverage is detailed and includes the application of inductive fault analysis to several manufactured circuits.

Chapter 3 is a tutorial survey of recent efforts in the area of fault simulation for analog and mixed-signal circuits. A wide range of algorithms are discussed, and illustrated using examples. Chapter 4 contains a review of efforts in automatic test pattern generation for analog and mixed-signal circuits. The discussion is focused on the intuition behind various approaches, rather than on the specific details of the various approaches.

Chapter 5 discusses a variety of design for test techniques. The discussion is oriented to the types of circuits used commonly by designers such as data converters, filters and operational amplifiers. Chapter 6 reviews spectrum-based built-in self test methods. The review discusses the methods used to generate signals on chip, observe the results, their relative quality and BIST schemes for circuits of practical interest.

Chapter 7 introduces the new board-level analog test bus standard. In addition to the standard itself, the chapter discusses the application of the standard in example circuits and methods to measure signals of interest.

Chapter 8 covers the class of switched-current circuits. The chapter introduces switched-current structures for common applications, and methods to test these circuits. The topics discussed include fault modeling, test generation and built-in self test schemes.

Every effort has been made to eliminate overlap between chapters and to eliminate errors from the material in this book. Of course, a few more are likely to have escaped the attention of our test process. Any information from readers about the remaining errors will be much appreciated.

About the Author:

BAPIRAJU VINNAKOTA is an Associate Professor of Electrical Engineering at the University of Minnesota, Minneapolis, Minnesota.

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