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Published by Springer, 2006
ISBN 10: 3540269096ISBN 13: 9783540269090
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Published by Springer, 2006
ISBN 10: 3540269096ISBN 13: 9783540269090
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Published by Springer, 2006
ISBN 10: 3540269096ISBN 13: 9783540269090
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Published by Springer, 2006
ISBN 10: 3540269096ISBN 13: 9783540269090
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Published by Springer, 2006
ISBN 10: 3540269096ISBN 13: 9783540269090
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Published by Springer, 2006
ISBN 10: 3540269096ISBN 13: 9783540269090
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Published by Springer, 2006
ISBN 10: 3540269096ISBN 13: 9783540269090
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Published by Springer, 2006
ISBN 10: 3540269096ISBN 13: 9783540269090
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Published by Springer, 2006
ISBN 10: 3540269096ISBN 13: 9783540269090
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Published by Springer, 2006
ISBN 10: 3540269096ISBN 13: 9783540269090
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Published by Springer Berlin Heidelberg, 2006
ISBN 10: 3540269096ISBN 13: 9783540269090
Seller: Buchpark, Trebbin, Germany
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Condition: Sehr gut. Zustand: Sehr gut - Neubindung, Buchschnitt leicht verkürzt | Seiten: 424 | Sprache: Englisch.
Published by Springer, 2006
ISBN 10: 3540269096ISBN 13: 9783540269090
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Published by Springer, 2006
ISBN 10: 3540269096ISBN 13: 9783540269090
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Published by Springer, 2006
ISBN 10: 3540269096ISBN 13: 9783540269090
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Published by Springer Berlin Heidelberg, 2006
ISBN 10: 3540269096ISBN 13: 9783540269090
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Gebunden. Condition: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. First book summarizing the state of the art of this techniqueReal industrial applications includedThe Nobel Prize of 1986 on Sc- ning Tunneling Microscopy sig- led a new era in imaging. The sc- ning probes emerged as a new i- trument for i.
Published by Springer Berlin Heidelberg Feb 2006, 2006
ISBN 10: 3540269096ISBN 13: 9783540269090
Seller: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, Germany
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Buch. Condition: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -The Nobel Prize of 1986 on Sc- ning Tunneling Microscopy sig- led a new era in imaging. The sc- ning probes emerged as a new i- trument for imaging with a pre- sion suf cient to delineate single atoms. At rst there were two - the Scanning Tunneling Microscope, or STM, and the Atomic Force Mic- scope, or AFM. The STM relies on electrons tunneling between tip and sample whereas the AFM depends on the force acting on the tip when it was placed near the sample. These were quickly followed by the - gneticForceMicroscope,MFM,and the Electrostatic Force Microscope, EFM. The MFM will image a single magnetic bit with features as small as 10nm. With the EFM one can monitor the charge of a single electron. Prof. Paul Hansma at Santa Barbara opened the door even wider when he was able to image biological objects in aqueous environments. At this point the sluice gates were opened and a multitude of different instruments appeared. There are signi cant differences between the Scanning Probe Microscopes or SPM, and others such as the Scanning Electron Microscope or SEM. The probe microscopes do not require preparation of the sample and they operate in ambient atmosphere, whereas, the SEM must operate in a vacuum environment and the sample must be cross-sectioned to expose the proper surface. However, the SEM can record 3D image and movies, features that are not available with the scanning probes. 424 pp. Englisch.
Published by Springer Berlin Heidelberg, 2006
ISBN 10: 3540269096ISBN 13: 9783540269090
Seller: AHA-BUCH GmbH, Einbeck, Germany
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Buch. Condition: Neu. Druck auf Anfrage Neuware - Printed after ordering - The Nobel Prize of 1986 on Sc- ning Tunneling Microscopy sig- led a new era in imaging. The sc- ning probes emerged as a new i- trument for imaging with a pre- sion suf cient to delineate single atoms. At rst there were two - the Scanning Tunneling Microscope, or STM, and the Atomic Force Mic- scope, or AFM. The STM relies on electrons tunneling between tip and sample whereas the AFM depends on the force acting on the tip when it was placed near the sample. These were quickly followed by the - gneticForceMicroscope,MFM,and the Electrostatic Force Microscope, EFM. The MFM will image a single magnetic bit with features as small as 10nm. With the EFM one can monitor the charge of a single electron. Prof. Paul Hansma at Santa Barbara opened the door even wider when he was able to image biological objects in aqueous environments. At this point the sluice gates were opened and a multitude of different instruments appeared. There are signi cant differences between the Scanning Probe Microscopes or SPM, and others such as the Scanning Electron Microscope or SEM. The probe microscopes do not require preparation of the sample and they operate in ambient atmosphere, whereas, the SEM must operate in a vacuum environment and the sample must be cross-sectioned to expose the proper surface. However, the SEM can record 3D image and movies, features that are not available with the scanning probes.
Published by Springer Verlag, 2006
ISBN 10: 3540269096ISBN 13: 9783540269090
Seller: Revaluation Books, Exeter, United Kingdom
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Hardcover. Condition: Brand New. 1st edition. 378 pages. 9.50x6.75x0.75 inches. In Stock.
Published by Springer-Verlag Berlin and Heidelberg GmbH & Co. KG, 2005
ISBN 10: 3540269096ISBN 13: 9783540269090
Seller: Kennys Bookshop and Art Galleries Ltd., Galway, GY, Ireland
Book
Condition: New. Provides a comprehensive overview of SPM applications. The international perspective offered in these three volumes contributes to the evolution of SPM techniques. Volumes II, III and IV examine the physical and technical foundation for progress in applied near-field scanning probe techniques. Editor(s): Bhushan, Bharat; Fuchs, Harald. Series: Nanoscience and Technology. Num Pages: 422 pages, 268 black & white illustrations, 2 colour illustrations, 3 black & white tables, biograph. BIC Classification: PDND. Category: (P) Professional & Vocational. Dimension: 243 x 166 x 21. Weight in Grams: 716. . 2005. Hardback. . . . .
Published by Springer, 2006
ISBN 10: 3540269096ISBN 13: 9783540269090
Seller: GreatBookPricesUK, Castle Donington, DERBY, United Kingdom
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Published by Springer, 2006
ISBN 10: 3540269096ISBN 13: 9783540269090
Seller: Mispah books, Redhill, SURRE, United Kingdom
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Hardcover. Condition: Like New. Like New. book.
Published by Springer-Verlag Berlin and Heidelberg GmbH & Co. KG, 2006
ISBN 10: 3540269096ISBN 13: 9783540269090
Seller: Kennys Bookstore, Olney, MD, U.S.A.
Book
Condition: New. Provides a comprehensive overview of SPM applications. The international perspective offered in these three volumes contributes to the evolution of SPM techniques. Volumes II, III and IV examine the physical and technical foundation for progress in applied near-field scanning probe techniques. Editor(s): Bhushan, Bharat; Fuchs, Harald. Series: Nanoscience and Technology. Num Pages: 422 pages, 268 black & white illustrations, 2 colour illustrations, 3 black & white tables, biograph. BIC Classification: PDND. Category: (P) Professional & Vocational. Dimension: 243 x 166 x 21. Weight in Grams: 716. . 2005. Hardback. . . . . Books ship from the US and Ireland.