Applied Scanning Probe Methods XI: Scanning Probe Microscopy Techniques (NanoScience and Technology) - Hardcover

Hardcover

ISBN 10: 3540850368 ISBN 13: 9783540850366

Publisher: Springer, 2008

Synopsis

The volumes XI, XII and XIII examine the physical and technical foundation for recent progress in applied scanning probe techniques. These volumes constitute a timely comprehensive overview of SPM applications. Real industrial applications are included.

About this title

Review:

From the reviews:

"Vol. XI contains contributions about recent developments in scanning probe microscopy techniques. ... The editors and their talented authors have been among the leaders in the study of probe methods. ... Each chapter captures both the excitement and the importance of the work and conclusions reported, and will make profitable reading for researchers at all experience levels. ... All the chapters are supported by extensive lists of references and beautifully illustrated and in color too, also along with graphs, equations etc." (Current Engineering Practice, 2009)

“The articles ... are written in sufficient detail, so that university students, researchers and engineers can understand the physics of the instruments, the design and construction of the devices and the cantilevers, the signal processing algorithms, and their use in imaging and the surface characterization of the specimens. ... SPM includes a variety of techniques, including scanning near-field optical microscopy, which has interesting applications ... . well-written and clearly illustrated. ... contain ample experimental data and significant discussion of limitations and artifacts.” (Barry R. Masters, Optics & Photonics News, September, 2009)

Synopsis:

The volumes XI, XII and XIII examine the physical and technical foundation for recent progress in applied scanning probe techniques. The first volume came out in January 2004, the second to fourth volumes in early 2006 and the fifth to seventh volumes in late 2006. The field is progressing so fast that there is a need for a set of volumes every 12 to 18 months to capture latest developments. These volumes constitute a timely comprehensive overview of SPM applications. After introducing scanning probe microscopy, including sensor technology and tip characterization, chapters on use in various industrial applications are presented. Industrial applications span topographic and dynamical surface studies of thin-film semiconductors, polymers, paper, ceramics, and magnetic and biological materials. The chapters have been written by leading researchers and application scientists from all over the world and from various industries to provide a broader perspective.

About this edition

• Publisher: Springer
• Publication date: 2008
• ISBN 10: 3540850368
• ISBN 13: 9783540850366
• Binding: Hardcover
• Number of pages: 292
• Editor: Bhushan Bharat, Fuchs Harald