VLSI Test Principles and Architectures,: Design for Testability (Morgan Kaufmann Series in Systems on Silicon (Hardcover)) - Hardcover

Laung-Terng Wang

Hardcover

ISBN 10: 0123705975 ISBN 13: 9780123705976

Publisher: Morgan Kaufmann, 2006

Synopsis

This book is a comprehensive guide to new DFT methods that will show the readers how to design a testable and quality product, drive down test cost, improve product quality and yield, and speed up time-to-market and time-to-volume.

• Most up-to-date coverage of design for testability.
• Coverage of industry practices commonly found in commercial DFT tools but not discussed in other books. 
• Numerous, practical examples in each chapter illustrating basic VLSI test principles and DFT architectures.

About this title

Review:

The most up-to-date coverage available of VLSI Testing and Design-for-Testability!

Synopsis:

This book is a comprehensive guide to new DFT methods that will show the readers how to design a testable and quality product, drive down test cost, improve product quality and yield, and speed up time-to-market and time-to-volume. It provides most up-to-date coverage of design for testability. It presents coverage of industry practices commonly found in commercial DFT tools but not discussed in other books. It contains numerous, practical examples in each chapter illustrating basic VLSI test principles and DFT architectures. Lecture slides and exercise solutions for all chapters are now available. Instructors are also eligible for downloading PPT slide files and MSWORD solutions files from the manual website.

About this edition

• Publisher: Morgan Kaufmann
• Publication date: 2006
• ISBN 10: 0123705975
• ISBN 13: 9780123705976
• Binding: Hardcover
• Number of pages: 250