Principles of Semiconductor Network Testing

Afshar, Amir

ISBN 10: 0750694726 / ISBN 13: 9780750694728

Published by Newnes, 1995

About this Item

First Edition, First Printing. Published by Butterworth-Heinemann, 1995. Octavo. Book is like new. 30 day money back guarantee. NEXT DAY SHIPPING! Excellent customer service. Please email with any questions or if you would like a photo. All books packed carefully and ship with free delivery confirmation/tracking. All books come with free bookmarks. Ships from Sag Harbor, New York.

Seller Inventory # 178901

Bibliographic Details

• Title: Principles of Semiconductor Network Testing
• Publisher: Newnes
• Publication Date: 1995
• Language: English
• ISBN 10: 0750694726
• ISBN 13: 9780750694728
• Binding: Hardcover
• Edition: First Edition.
• Condition: Like New
• Seller catalogs:
  • Science & Nature

About this title

Synopsis

Principles of Semiconductor Network Testing gathers together comprehensive information which test and process professionals will find invaluable. The techniques outlined will help ensure that test methods and data collected reflect actual device performance, rather than 'testing the tester' or being lost in the noise floor.

This book addresses the fundamental issues underlying the semiconductor test discipline. The test engineer must understand the basic principles of semiconductor fabrication and process and have an in-depth knowledge of circuit functions, instrumentation and noise sources.

• Introduces a novel component-testing philosophy for semiconductor test, product and design engineers
• Best new source of information for experienced semiconductor engineers as well as entry-level personnel
• Eight chapters about semiconductor testing

Synopsis

This book gathers together comprehensive information which test and process professionals will find invaluable. The techniques outlined will help ensure that test methods and data collected reflect actual device performance, rather than 'testing the tester' or being lost in the noise floor. This book addresses the fundamental issues underlying the semiconductor test discipline. The test engineer must understand the basic principles of semiconductor fabrication and process and have an in-depth knowledge of circuit functions, instrumentation and noise sources. It introduces a novel component-testing philosophy for semiconductor test, product and design engineers. It provides best new source of information for experienced semiconductor engineers as well as entry-level personnel. It includes eight chapters about semiconductor testing.