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Yield Variability Optimization Integrated by Jian Cheng (14 results)
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Yield and Variability Optimization of Integrated Circuits (Hardcover)
Language: English
Published by Kluwer Academic Publishers, Dordrecht, 1995
ISBN 10: 0792395514 ISBN 13: 9780792395515
Hardcover. Condition: new. Hardcover. This text deals with the primary and theoretical and practical aspects of IC statistical design and covers the important issues of IC statistical design and the relevant mathematical framework. It describes a spectrum of different statistical circuit design problems, such as parametric yield optimization, generalized on-target design, variability minimization, performance tuning, and worst-case design. It also covers such topics as device statistical and worst-case modelling, design of experiments and factor screening, together with some basic tenets of fuzzy set theory and multi-objective statistical optimization. Several practical examples are used to familiarize the reader with the concepts, and demonstrate the applicability of various statistical circuit design methodologies. This book is intended as introductory reference material for various groups of IC designers, and the methodologies described provide an understanding of the complex problems of statistical circuit design, thus helping to enhance the overall quality of the ICs delivered to the customers. Traditionally, Computer Aided Design (CAD) tools have been used to create the nominal design of an integrated circuit (IC), such that the circuit nominal response meets the desired performance specifications. Shipping may be from multiple locations in the US or from the UK, depending on stock availability.
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Yield and Variability Optimization of Integrated Circuits
Seller: Ria Christie Collections, Uxbridge, United Kingdom
Seller rating 5 out of 5 stars
£ 94.30
£ 11.98 shipping
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Yield and Variability Optimization of Integrated Circuits
Seller: Ria Christie Collections, Uxbridge, United Kingdom
Seller rating 5 out of 5 stars
£ 94.62
£ 11.98 shipping
Ships from United Kingdom to U.S.A.Quantity: Over 20 available
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Condition: New.
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Yield and Variability Optimization of Integrated Circuits
Language: English
Published by Kluwer Academic Publishers, 1995
ISBN 10: 0792395514 ISBN 13: 9780792395515
Seller: Kennys Bookshop and Art Galleries Ltd., Galway, GY, Ireland
Seller rating 5 out of 5 stars
Condition: New. Deals with the primary and theoretical and practical aspects of IC statistical design and covers the important issues of IC statistical design and the relevant mathematical framework. This book is intended as introductory reference material for various groups of IC designers. Num Pages: 234 pages, biography. BIC Classification: TJFC; TJFD. Category: (P) Professional & Vocational; (UP) Postgraduate, Research & Scholarly. Dimension: 234 x 156 x 15. Weight in Grams: 542. . 1995. Hardback. . . . .
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Yield and Variability Optimization of Integrated Circuits
Language: English
Published by Kluwer Academic Publishers, 1995
ISBN 10: 0792395514 ISBN 13: 9780792395515
Condition: New. Deals with the primary and theoretical and practical aspects of IC statistical design and covers the important issues of IC statistical design and the relevant mathematical framework. This book is intended as introductory reference material for various groups of IC designers. Num Pages: 234 pages, biography. BIC Classification: TJFC; TJFD. Category: (P) Professional & Vocational; (UP) Postgraduate, Research & Scholarly. Dimension: 234 x 156 x 15. Weight in Grams: 542. . 1995. Hardback. . . . . Books ship from the US and Ireland.
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Paperback. Condition: Like New. Like New. book.
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Condition: As New. Unread book in perfect condition.
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Yield and Variability Optimization of Integrated Circuits (Hardcover)
Language: English
Published by Kluwer Academic Publishers, Dordrecht, 1995
ISBN 10: 0792395514 ISBN 13: 9780792395515
Hardcover. Condition: new. Hardcover. This text deals with the primary and theoretical and practical aspects of IC statistical design and covers the important issues of IC statistical design and the relevant mathematical framework. It describes a spectrum of different statistical circuit design problems, such as parametric yield optimization, generalized on-target design, variability minimization, performance tuning, and worst-case design. It also covers such topics as device statistical and worst-case modelling, design of experiments and factor screening, together with some basic tenets of fuzzy set theory and multi-objective statistical optimization. Several practical examples are used to familiarize the reader with the concepts, and demonstrate the applicability of various statistical circuit design methodologies. This book is intended as introductory reference material for various groups of IC designers, and the methodologies described provide an understanding of the complex problems of statistical circuit design, thus helping to enhance the overall quality of the ICs delivered to the customers. Traditionally, Computer Aided Design (CAD) tools have been used to create the nominal design of an integrated circuit (IC), such that the circuit nominal response meets the desired performance specifications. Shipping may be from our Sydney, NSW warehouse or from our UK or US warehouse, depending on stock availability.
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Condition: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Traditionally, Computer Aided Design (CAD) tools have been used to create the nominal design of an integrated circuit (IC), such that the circuit nominal response meets the desired performance specifications. In reality, however, due to the disturbances oft.
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Gebunden. Condition: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Traditionally, Computer Aided Design (CAD) tools have been used to create the nominal design of an integrated circuit (IC), such that the circuit nominal response meets the desired performance specifications. In reality, however, due to the disturbances oft.
