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Reflection Electron Microscopy Spectroscopy by Wang Zhong (30 results)
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Reflection Electron Microscopy And Spectroscopy for Surface Analysis
Language: English
Published by Cambridge University Press, 2005
ISBN 10: 0521017955 ISBN 13: 9780521017954
Condition: New.
-
Reflection Electron Microscopy and Spectroscopy for Surface Analysis (Volume 0)
Language: English
Published by Cambridge University Press, 2005
ISBN 10: 0521017955 ISBN 13: 9780521017954
Condition: New.
-
Reflection Electron Microscopy and Spectroscopy for Surface Analysis (Volume 0)
Language: English
Published by Cambridge University Press, 2005
ISBN 10: 0521017955 ISBN 13: 9780521017954
Seller: Ria Christie Collections, Uxbridge, United Kingdom
Seller rating 5 out of 5 stars
£ 55.93
£ 11.98 shipping
Ships from United Kingdom to U.S.A.Quantity: Over 20 available
Add to basketCondition: New. In.
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Reflection Electron Microscopy And Spectroscopy for Surface Analysis
Language: English
Published by Cambridge University Press, 2005
ISBN 10: 0521017955 ISBN 13: 9780521017954
Seller: GreatBookPricesUK, Woodford Green, United Kingdom
Seller rating 5 out of 5 stars
Condition: New.
-
Reflection Electron Microscopy and Spectroscopy for Surface Analysis
Language: English
Published by Cambridge University Press, 2005
ISBN 10: 0521017955 ISBN 13: 9780521017954
Taschenbuch. Condition: Neu. Druck auf Anfrage Neuware - Printed after ordering - In this book the theories, techniques and applications of reflection electron microscopy (REM), reflection high-energy electron diffraction (RHEED) and reflection electron energy-loss spectroscopy (REELS) are comprehensively reviewed for the first time. The book is divided into three parts: diffraction, imaging and spectroscopy. The text is written to combine basic techniques with special applications, theories with experiments, and the basic physics with materials science, so that a full picture of RHEED and REM emerges. An entirely self-contained study, the book contains much invaluable reference material, including FORTRAN source codes for calculating crystal structures data and electron energy loss spectra in different scattering geometries. This and many other features make the book an important and timely addition to the materials science literature.
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Reflection Electron Microscopy And Spectroscopy for Surface Analysis
Language: English
Published by Cambridge University Press, 2005
ISBN 10: 0521017955 ISBN 13: 9780521017954
Seller: GreatBookPricesUK, Woodford Green, United Kingdom
Seller rating 5 out of 5 stars
£ 120.99
£ 15 shipping
Ships from United Kingdom to U.S.A.Quantity: Over 20 available
Add to basketCondition: As New. Unread book in perfect condition.
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Reflection Electron Microscopy and Spectroscopy for Surface Analysis
Language: English
Published by Cambridge University Press, 2005
ISBN 10: 0521017955 ISBN 13: 9780521017954
paperback. Condition: Like New. LIKE NEW. SHIPS FROM MULTIPLE LOCATIONS. book.
-
Reflection Electron Microscopy And Spectroscopy for Surface Analysis
Language: English
Published by Cambridge University Press, 2005
ISBN 10: 0521017955 ISBN 13: 9780521017954
Condition: As New. Unread book in perfect condition.
-
Reflection Electron Microscopy and Spectroscopy for Surface Analysis
Language: English
Published by Cambridge University Press, 1996
ISBN 10: 0521482666 ISBN 13: 9780521482660
Condition: New.
-
Reflection Electron Microscopy and Spectroscopy for Surface Analysis
Language: English
Published by Cambridge University Press, 1996
ISBN 10: 0521482666 ISBN 13: 9780521482660
Seller: Ria Christie Collections, Uxbridge, United Kingdom
Seller rating 5 out of 5 stars
£ 133.75
£ 11.98 shipping
Ships from United Kingdom to U.S.A.Quantity: Over 20 available
Add to basketCondition: New. In.
-
Reflection Electron Microscopy and Spectroscopy for Surface Analysis
Language: English
Published by Cambridge University Press, 1996
ISBN 10: 0521482666 ISBN 13: 9780521482660
Hardcover. Condition: Like New. LIKE NEW. SHIPS FROM MULTIPLE LOCATIONS. book.
-
Reflection Electron Microscopy and Spectroscopy for Surface Analysis
Language: English
Published by Cambridge University Press, 1996
ISBN 10: 0521482666 ISBN 13: 9780521482660
Seller: Kennys Bookshop and Art Galleries Ltd., Galway, GY, Ireland
Seller rating 5 out of 5 stars
Condition: New. A self-contained book on electron microscopy and spectrometry techniques for surface studies. Num Pages: 458 pages, 224 b/w illus. 10 tables. BIC Classification: PHK; TGM. Category: (P) Professional & Vocational. Dimension: 247 x 174 x 25. Weight in Grams: 1097. . 1996. hardcover. . . . .
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Reflection Electron Microscopy and Spectroscopy for Surface Analysis
Language: English
Published by Cambridge University Press, 1996
ISBN 10: 0521482666 ISBN 13: 9780521482660
Condition: New. A self-contained book on electron microscopy and spectrometry techniques for surface studies. Num Pages: 458 pages, 224 b/w illus. 10 tables. BIC Classification: PHK; TGM. Category: (P) Professional & Vocational. Dimension: 247 x 174 x 25. Weight in Grams: 1097. . 1996. hardcover. . . . . Books ship from the US and Ireland.
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Reflection Electron Microscopy and Spectroscopy for Surface Analysis
Language: English
Published by Cambridge University Press, 1996
ISBN 10: 0521482666 ISBN 13: 9780521482660
Hardcover. Condition: Brand New. 436 pages. 10.25x7.25x1.00 inches. In Stock.
-
Reflection Electron Microscopy and Spectroscopy for Surface Analysis
Language: English
Published by Cambridge University Press, 1996
ISBN 10: 0521482666 ISBN 13: 9780521482660
Buch. Condition: Neu. Druck auf Anfrage Neuware - Printed after ordering - In this book the theories, techniques and applications of reflection electron microscopy (REM), reflection high-energy electron diffraction (RHEED) and reflection electron energy-loss spectroscopy (REELS) are comprehensively reviewed for the first time. The book is divided into three parts: diffraction, imaging and spectroscopy. The text is written to combine basic techniques with special applications, theories with experiments, and the basic physics with materials science, so that a full picture of RHEED and REM emerges. An entirely self-contained study, the book contains much invaluable reference material, including FORTRAN source codes for calculating crystal structures data and electron energy loss spectra in different scattering geometries. This and many other features make the book an important and timely addition to the materials science literature.
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Reflection Electron Microscopy and Spectroscopy for Surface Analysis
Published by Published by Cambridge at the University Press First Edition . London 1996., 1996
Seller: Little Stour Books PBFA Member, Canterbury, United Kingdom
Association Member: PBFA
Seller rating 5 out of 5 stars
First Edition
Condition: Fine. First edition hard back binding in publisher's original black paper covers, gilt title and author lettering to the spine. Quarto 10'' x 7''. Contains [xix] 436 printed pages of text with monochrome illustrations and photographs throughout. Fine condition book in Fine condition dust wrapper. Dust wrapper supplied in archive acetate film protection, this preserves and prolongs the life of the paper, it is not adhered to the book or to the dust wrapper. Member of the P.B.F.A. ISBN 0521482666 MICROBIOLOGICAL.
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Reflection Electron Microscopy and Spectroscopy for Surface Analysis (Paperback)
Language: English
Published by Cambridge University Press, Cambridge, 2005
ISBN 10: 0521017955 ISBN 13: 9780521017954
Paperback. Condition: new. Paperback. In this book the theories, techniques and applications of reflection electron microscopy (REM), reflection high-energy electron diffraction (RHEED) and reflection electron energy-loss spectroscopy (REELS) are comprehensively reviewed for the first time. The book is divided into three parts: diffraction, imaging and spectroscopy. The text is written to combine basic techniques with special applications, theories with experiments, and the basic physics with materials science, so that a full picture of RHEED and REM emerges. An entirely self-contained study, the book contains much invaluable reference material, including FORTRAN source codes for calculating crystal structures data and electron energy loss spectra in different scattering geometries. This and many other features make the book an important and timely addition to the materials science literature. Entirely self-contained, this book serves as a comprehensive source for graduate students and working scientists using electron microscopy and spectrometry techniques for surface studies. The text is written to combine basic techniques with special applications, theories with experiments giving a complete coverage of RHEED and REM. This item is printed on demand. Shipping may be from multiple locations in the US or from the UK, depending on stock availability.
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Paperback. Condition: Brand New. 456 pages. 9.50x6.70x1.10 inches. In Stock. This item is printed on demand.
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Reflection Electron Microscopy and Spectroscopy for Surface Analysis
Language: English
Published by Cambridge University Press, 2005
ISBN 10: 0521017955 ISBN 13: 9780521017954
Condition: New. Print on Demand pp. 460 67:B&W 6.69 x 9.61 in or 244 x 170 mm (Pinched Crown) Perfect Bound on White w/Gloss Lam.
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Reflection Electron Microscopy and Spectroscopy for Surface Analysis
Language: English
Published by Cambridge University Press, 2005
ISBN 10: 0521017955 ISBN 13: 9780521017954
Condition: New. PRINT ON DEMAND pp. 460.
-
Reflection Electron Microscopy and Spectroscopy for Surface Analysis
Language: English
Published by Cambridge University Press CUP, 2005
ISBN 10: 0521017955 ISBN 13: 9780521017954
Condition: New. Print on Demand pp. 460.
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Reflection Electron Microscopy and Spectroscopy for Surface Analysis
Language: English
Published by Cambridge University Press, 2005
ISBN 10: 0521017955 ISBN 13: 9780521017954
Seller: THE SAINT BOOKSTORE, Southport, United Kingdom
Seller rating 5 out of 5 stars
£ 63.25
£ 18.35 shipping
Ships from United Kingdom to U.S.A.Quantity: Over 20 available
Add to basketPaperback / softback. Condition: New. This item is printed on demand. New copy - Usually dispatched within 5-9 working days.
-
Reflection Electron Microscopy and Spectroscopy for Surface Analysis (Paperback)
Language: English
Published by Cambridge University Press, Cambridge, 2005
ISBN 10: 0521017955 ISBN 13: 9780521017954
Paperback. Condition: new. Paperback. In this book the theories, techniques and applications of reflection electron microscopy (REM), reflection high-energy electron diffraction (RHEED) and reflection electron energy-loss spectroscopy (REELS) are comprehensively reviewed for the first time. The book is divided into three parts: diffraction, imaging and spectroscopy. The text is written to combine basic techniques with special applications, theories with experiments, and the basic physics with materials science, so that a full picture of RHEED and REM emerges. An entirely self-contained study, the book contains much invaluable reference material, including FORTRAN source codes for calculating crystal structures data and electron energy loss spectra in different scattering geometries. This and many other features make the book an important and timely addition to the materials science literature. Entirely self-contained, this book serves as a comprehensive source for graduate students and working scientists using electron microscopy and spectrometry techniques for surface studies. The text is written to combine basic techniques with special applications, theories with experiments giving a complete coverage of RHEED and REM. This item is printed on demand. Shipping may be from our UK warehouse or from our Australian or US warehouses, depending on stock availability.
-
Reflection Electron Microscopy and Spectroscopy for Surface Analysis
Language: English
Published by Cambridge University Press, 2005
ISBN 10: 0521017955 ISBN 13: 9780521017954
Condition: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Entirely self-contained, this book serves as a comprehensive source for graduate students and working scientists using electron microscopy and spectrometry techniques for surface studies. The text is written to combine basic techniques with special applicat.
-
Reflection Electron Microscopy and Spectroscopy for Surface Analysis
Language: English
Published by Cambridge University Press, 2005
ISBN 10: 0521017955 ISBN 13: 9780521017954
Taschenbuch. Condition: Neu. Reflection Electron Microscopy and Spectroscopy for Surface Analysis | Zhong Lin Wang (u. a.) | Taschenbuch | Kartoniert / Broschiert | Englisch | 2005 | Cambridge University Press | EAN 9780521017954 | Verantwortliche Person für die EU: Libri GmbH, Europaallee 1, 36244 Bad Hersfeld, gpsr[at]libri[dot]de | Anbieter: preigu Print on Demand.
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Reflection Electron Microscopy and Spectroscopy for Surface Analysis (Hardcover)
Language: English
Published by Cambridge University Press, Cambridge, 1996
ISBN 10: 0521482666 ISBN 13: 9780521482660
Hardcover. Condition: new. Hardcover. In this book the theories, techniques and applications of reflection electron microscopy (REM), reflection high-energy electron diffraction (RHEED) and reflection electron energy-loss spectroscopy (REELS) are comprehensively reviewed for the first time. The book is divided into three parts: diffraction, imaging and spectroscopy. The text is written to combine basic techniques with special applications, theories with experiments, and the basic physics with materials science, so that a full picture of RHEED and REM emerges. An entirely self-contained study, the book contains much invaluable reference material, including FORTRAN source codes for calculating crystal structures data and electron energy loss spectra in different scattering geometries. This and many other features make the book an important and timely addition to the materials science literature. This book is a source for graduate students and working scientists using electron microscopy and spectrometry techniques for surface studies. The text is written to combine basic techniques with special applications, theories with experiments giving a complete coverage of RHEED and REM. This item is printed on demand. Shipping may be from multiple locations in the US or from the UK, depending on stock availability.
-
Reflection Electron Microscopy and Spectroscopy for Surface Analysis
Language: English
Published by Cambridge University Press, 1996
ISBN 10: 0521482666 ISBN 13: 9780521482660
Hardcover. Condition: Brand New. 436 pages. 10.25x7.25x1.00 inches. In Stock. This item is printed on demand.
-
Reflection Electron Microscopy and Spectroscopy for Surface Analysis (Hardcover)
Language: English
Published by Cambridge University Press, Cambridge, 1996
ISBN 10: 0521482666 ISBN 13: 9780521482660
Hardcover. Condition: new. Hardcover. In this book the theories, techniques and applications of reflection electron microscopy (REM), reflection high-energy electron diffraction (RHEED) and reflection electron energy-loss spectroscopy (REELS) are comprehensively reviewed for the first time. The book is divided into three parts: diffraction, imaging and spectroscopy. The text is written to combine basic techniques with special applications, theories with experiments, and the basic physics with materials science, so that a full picture of RHEED and REM emerges. An entirely self-contained study, the book contains much invaluable reference material, including FORTRAN source codes for calculating crystal structures data and electron energy loss spectra in different scattering geometries. This and many other features make the book an important and timely addition to the materials science literature. This book is a source for graduate students and working scientists using electron microscopy and spectrometry techniques for surface studies. The text is written to combine basic techniques with special applications, theories with experiments giving a complete coverage of RHEED and REM. This item is printed on demand. Shipping may be from our UK warehouse or from our Australian or US warehouses, depending on stock availability.
-
Reflection Electron Microscopy and Spectroscopy for Surface Analysis
Language: English
Published by Cambridge University Press, 2015
ISBN 10: 0521482666 ISBN 13: 9780521482660
Condition: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Entirely self-contained, this book serves as a comprehensive source for graduate students and working scientists using electron microscopy and spectrometry techniques for surface studies. The text is written to combine basic techniques with special applicat.
-
Reflection Electron Microscopy and Spectroscopy for Surface Analysis
Language: English
Published by Cambridge University Press, 1996
ISBN 10: 0521482666 ISBN 13: 9780521482660
Seller: THE SAINT BOOKSTORE, Southport, United Kingdom
Seller rating 5 out of 5 stars
£ 177.70
£ 22.02 shipping
Ships from United Kingdom to U.S.A.Quantity: Over 20 available
Add to basketHardback. Condition: New. This item is printed on demand. New copy - Usually dispatched within 5-9 working days.
