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Lifetime Spectroscopy Method Defect by Rein Stefan (12 results)
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£ 145.65
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Add to basketCondition: New. This is a Brand-new US Edition. This Item may be shipped from US or any other country as we have multiple locations worldwide.
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£ 145.65
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Add to basketCondition: Brand New. New. US edition. Expediting shipping for all USA and Europe orders excluding PO Box. Excellent Customer Service.
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Lifetime Spectroscopy: A Method of Defect Characterization in Silicon for Photovoltaic Applications (Springer Series in Materials Science, 85)
Seller: Ria Christie Collections, Uxbridge, United Kingdom
Seller rating 5 out of 5 stars
£ 180.82
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Add to basketCondition: New. In.
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Lifetime Spectroscopy: A Method of Defect Characterization in Silicon for Photovoltaic Applications (Springer Series in Materials Science, 85)
Seller: Ria Christie Collections, Uxbridge, United Kingdom
Seller rating 5 out of 5 stars
£ 264.02
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Add to basketCondition: New. In English.
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Lifetime Spectroscopy : A Method of Defect Characterization in Silicon for Photovoltaic Applications
Published by Springer Berlin Heidelberg, 2005
ISBN 10: 3540253033 ISBN 13: 9783540253037
Language: English
£ 285.91
Convert currency£ 12.10 shipping from Germany to United KingdomQuantity: 1 available
Add to basketBuch. Condition: Neu. Druck auf Anfrage Neuware - Printed after ordering - Lifetime spectroscopy is one of the most sensitive diagnostic tools for the identification and analysis of impurities in semiconductors. Since it is based on the recombination process, it provides insight into precisely those defects that are relevant to semiconductor devices such as solar cells. This book introduces a transparent modeling procedure that allows a detailed theoretical evaluation of the spectroscopic potential of the different lifetime spectroscopic techniques. The various theoretical predictions are verified experimentally with the context of a comprehensive study on different metal impurities. The quality and consistency of the spectroscopic results, as explained here, confirms the excellent performance of lifetime spectroscopy.
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Lifetime Spectroscopy : A Method of Defect Characterization in Silicon for Photovoltaic Applications
Published by Springer Berlin Heidelberg, Springer Berlin Heidelberg, 2010
ISBN 10: 3642064531 ISBN 13: 9783642064531
Language: English
£ 285.91
Convert currency£ 12.10 shipping from Germany to United KingdomQuantity: 1 available
Add to basketTaschenbuch. Condition: Neu. Druck auf Anfrage Neuware - Printed after ordering - Lifetime spectroscopy is one of the most sensitive diagnostic tools for the identification and analysis of impurities in semiconductors. Since it is based on the recombination process, it provides insight into precisely those defects that are relevant to semiconductor devices such as solar cells. This book introduces a transparent modeling procedure that allows a detailed theoretical evaluation of the spectroscopic potential of the different lifetime spectroscopic techniques. The various theoretical predictions are verified experimentally with the context of a comprehensive study on different metal impurities. The quality and consistency of the spectroscopic results, as explained here, confirms the excellent performance of lifetime spectroscopy.
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£ 324.37
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£ 324.37
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Hardcover. Condition: Like New. Like New. book.
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Paperback. Condition: Brand New. 515 pages. 9.21x6.14x1.05 inches. In Stock.
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Hardcover. Condition: Brand New. 1st edition. 489 pages. German language. 9.25x6.50x0.75 inches. In Stock.
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£ 564.63
Convert currency£ 32.76 shipping from U.S.A. to United KingdomQuantity: 1 available
Add to baskethardcover. Condition: New. In shrink wrap. Looks like an interesting title!
