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Design Analysis Test Logic by Krishnaswamy Smita (39 results)
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Design, Analysis and Test of Logic Circuits Under Uncertainty.
Published by Dordrecht, Springer., 2013
ISBN 10: 9048196434 ISBN 13: 9789048196432
Language: English
Seller: Universitätsbuchhandlung Herta Hold GmbH, Berlin, Germany
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£ 16.99
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Add to basketXI, 123 p. 71 illus. Hardcover. Versand aus Deutschland / We dispatch from Germany via Air Mail. Einband bestoßen, daher Mängelexemplar gestempelt, sonst sehr guter Zustand. Imperfect copy due to slightly bumped cover, apart from this in very good condition. Stamped. Stamped. Lecture Notes in Electrical Engineering Bd. 115. Sprache: Englisch.
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Design, Analysis and Test of Logic Circuits Under Uncertainty
Published by Springer Netherlands, 2012
ISBN 10: 9048196434 ISBN 13: 9789048196432
Language: English
£ 14.50
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Add to basketCondition: Sehr gut. Zustand: Sehr gut | Sprache: Englisch | Produktart: Bücher.
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Design, Analysis and Test of Logic Circuits Under Uncertainty (Lecture Notes in Electrical Engineering, 115)
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Design, Analysis and Test of Logic Circuits Under Uncertainty (Lecture Notes in Electrical Engineering, 115)
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Design, Analysis and Test of Logic Circuits Under Uncertainty
Published by Springer Netherlands, Springer Netherlands, 2012
ISBN 10: 9048196434 ISBN 13: 9789048196432
Language: English
£ 98.33
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Add to basketBuch. Condition: Neu. Druck auf Anfrage Neuware - Printed after ordering - Integrated circuits (ICs) increasingly exhibit uncertain characteristics due to soft errors, inherently probabilistic devices, and manufacturing variability. As device technologies scale, these effects can be detrimental to the reliability of logic circuits. To improve future semiconductor designs, this book describes methods for analyzing, designing, and testing circuits subject to probabilistic effects. The authors first develop techniques to model inherently probabilistic methods in logic circuits and to test circuits for determining their reliability after they are manufactured. Then, they study error-masking mechanisms intrinsic to digital circuits and show how to leverage them to design more reliable circuits. The book describes techniques for: Modeling and reasoning about probabilistic behavior in logic circuits, including a matrix-based reliability-analysis framework; Accurate analysis of soft-error rate (SER) based on functional-simulation, sufficiently scalable for use in gate-level optimizations; Logic synthesis for greater resilience against soft errors, which improves reliability using moderate overhead in area and performance; Test-generation and test-compaction methods aimed at probabilistic faults in logic circuits that facilitate accurate and efficient post-manufacture measurement of soft-error susceptibility.
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Design, Analysis and Test of Logic Circuits Under Uncertainty
Published by Springer Netherlands, Springer Netherlands, 2014
ISBN 10: 9400797982 ISBN 13: 9789400797987
Language: English
£ 98.33
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Add to basketTaschenbuch. Condition: Neu. Druck auf Anfrage Neuware - Printed after ordering - Logic circuits are becoming increasingly susceptible to probabilistic behavior caused by external radiation and process variation. In addition, inherently probabilistic quantum- and nano-technologies are on the horizon as we approach the limits of CMOS scaling. Ensuring the reliability of such circuits despite the probabilistic behavior is a key challenge in IC design---one that necessitates a fundamental, probabilistic reformulation of synthesis and testing techniques. This monograph will present techniques for analyzing, designing, and testing logic circuits with probabilistic behavior.
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Design, Analysis and Test of Logic Circuits Under Uncertainty
Seller: Kennys Bookshop and Art Galleries Ltd., Galway, GY, Ireland
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Add to basketCondition: New. Combining theory with practical examples, this volume presents a comprehensive overview of logic circuits. The text presents techniques used to analyze, design and test logic circuits with probabilistic behavior, and provides a multidisciplinary approach to uncertainty. Series: Lecture Notes in Electrical Engineering. Num Pages: 136 pages, 24 black & white tables, biography. BIC Classification: TJFC; UYF. Category: (P) Professional & Vocational. Dimension: 234 x 156 x 9. Weight in Grams: 371. . 2012. 2012. Hardback. . . . .
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Design, Analysis and Test of Logic Circuits Under Uncertainty
Published by Springer Netherlands, Springer Netherlands Sep 2012, 2012
ISBN 10: 9048196434 ISBN 13: 9789048196432
Language: English
Seller: buchversandmimpf2000, Emtmannsberg, BAYE, Germany
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Add to basketBuch. Condition: Neu. Neuware -Logic circuits are becoming increasingly susceptible to probabilistic behavior caused by external radiation and process variation. In addition, inherently probabilistic quantum- and nano-technologies are on the horizon as we approach the limits of CMOS scaling. Ensuring the reliability of such circuits despite the probabilistic behavior is a key challenge in IC design---one that necessitates a fundamental, probabilistic reformulation of synthesis and testing techniques. This monograph will present techniques for analyzing, designing, and testing logic circuits with probabilistic behavior.Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg 136 pp. Englisch.
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Hardcover. Condition: Brand New. 2013 edition. 134 pages. 9.25x6.25x0.50 inches. In Stock.
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Add to basketCondition: New. pp. 136.
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£ 138.19
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Add to basketCondition: New. Combining theory with practical examples, this volume presents a comprehensive overview of logic circuits. The text presents techniques used to analyze, design and test logic circuits with probabilistic behavior, and provides a multidisciplinary approach to uncertainty. Series: Lecture Notes in Electrical Engineering. Num Pages: 136 pages, 24 black & white tables, biography. BIC Classification: TJFC; UYF. Category: (P) Professional & Vocational. Dimension: 234 x 156 x 9. Weight in Grams: 371. . 2012. 2012. Hardback. . . . . Books ship from the US and Ireland.
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£ 104.64
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Add to basketPaperback. Condition: new. Paperback. Logic circuits are becoming increasingly susceptible to probabilistic behavior caused by external radiation and process variation. In addition, inherently probabilistic quantum- and nano-technologies are on the horizon as we approach the limits of CMOS scaling. Ensuring the reliability of such circuits despite the probabilistic behavior is a key challenge in IC design---one that necessitates a fundamental, probabilistic reformulation of synthesis and testing techniques. This monograph will present techniques for analyzing, designing, and testing logic circuits with probabilistic behavior. Logic circuits are becoming increasingly susceptible to probabilistic behavior caused by external radiation and process variation. Ensuring the reliability of such circuits despite the probabilistic behavior is a key challenge in IC design---one that necessitates a fundamental, probabilistic reformulation of synthesis and testing techniques. Shipping may be from multiple locations in the US or from the UK, depending on stock availability.
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Add to basketHardcover. Condition: new. Hardcover. Logic circuits are becoming increasingly susceptible to probabilistic behavior caused by external radiation and process variation. In addition, inherently probabilistic quantum- and nano-technologies are on the horizon as we approach the limits of CMOS scaling. Ensuring the reliability of such circuits despite the probabilistic behavior is a key challenge in IC design---one that necessitates a fundamental, probabilistic reformulation of synthesis and testing techniques. This monograph will present techniques for analyzing, designing, and testing logic circuits with probabilistic behavior. Logic circuits are becoming increasingly susceptible to probabilistic behavior caused by external radiation and process variation. Ensuring the reliability of such circuits despite the probabilistic behavior is a key challenge in IC design---one that necessitates a fundamental, probabilistic reformulation of synthesis and testing techniques. Shipping may be from multiple locations in the US or from the UK, depending on stock availability.
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Design, Analysis and Test of Logic Circuits Under Uncertainty
Seller: Kennys Bookshop and Art Galleries Ltd., Galway, GY, Ireland
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Add to basketCondition: New. Combining theory with practical examples, this volume presents a comprehensive overview of logic circuits. The text presents techniques used to analyze, design and test logic circuits with probabilistic behavior, and provides a multidisciplinary approach to uncertainty. Series: Lecture Notes in Electrical Engineering. Num Pages: 124 pages, 24 black & white tables, biography. BIC Classification: TJFC; UK; UMB; UYAM; UYD; UYF. Category: (P) Professional & Vocational. Dimension: 235 x 155 x 7. Weight in Grams: 221. . 2014. Paperback. . . . .
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Add to basketCondition: New. Combining theory with practical examples, this volume presents a comprehensive overview of logic circuits. The text presents techniques used to analyze, design and test logic circuits with probabilistic behavior, and provides a multidisciplinary approach to uncertainty. Series: Lecture Notes in Electrical Engineering. Num Pages: 124 pages, 24 black & white tables, biography. BIC Classification: TJFC; UK; UMB; UYAM; UYD; UYF. Category: (P) Professional & Vocational. Dimension: 235 x 155 x 7. Weight in Grams: 221. . 2014. Paperback. . . . . Books ship from the US and Ireland.
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Add to basketPaperback. Condition: new. Paperback. Logic circuits are becoming increasingly susceptible to probabilistic behavior caused by external radiation and process variation. In addition, inherently probabilistic quantum- and nano-technologies are on the horizon as we approach the limits of CMOS scaling. Ensuring the reliability of such circuits despite the probabilistic behavior is a key challenge in IC design---one that necessitates a fundamental, probabilistic reformulation of synthesis and testing techniques. This monograph will present techniques for analyzing, designing, and testing logic circuits with probabilistic behavior. Logic circuits are becoming increasingly susceptible to probabilistic behavior caused by external radiation and process variation. Ensuring the reliability of such circuits despite the probabilistic behavior is a key challenge in IC design---one that necessitates a fundamental, probabilistic reformulation of synthesis and testing techniques. Shipping may be from our Sydney, NSW warehouse or from our UK or US warehouse, depending on stock availability.
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£ 223.56
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Add to basketHardcover. Condition: new. Hardcover. Logic circuits are becoming increasingly susceptible to probabilistic behavior caused by external radiation and process variation. In addition, inherently probabilistic quantum- and nano-technologies are on the horizon as we approach the limits of CMOS scaling. Ensuring the reliability of such circuits despite the probabilistic behavior is a key challenge in IC design---one that necessitates a fundamental, probabilistic reformulation of synthesis and testing techniques. This monograph will present techniques for analyzing, designing, and testing logic circuits with probabilistic behavior. Logic circuits are becoming increasingly susceptible to probabilistic behavior caused by external radiation and process variation. Ensuring the reliability of such circuits despite the probabilistic behavior is a key challenge in IC design---one that necessitates a fundamental, probabilistic reformulation of synthesis and testing techniques. Shipping may be from our Sydney, NSW warehouse or from our UK or US warehouse, depending on stock availability.
