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Applied Scanning Probe Methods Part by Bhushan (1 results)
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Applied scanning probe methods. Part 9: Characterization. (=Nano Science and Technology; 9).
Published by Berlin, Springer, 2008
Language: English
Seller: Antiquariat Thomas Haker GmbH & Co. KG, Berlin, Germany
Association Member: GIAQ
Seller rating 5 out of 5 stars
Hardcover. Condition: Wie neu. LIX, 387 S. : Ill., graph. Darst. Like new. Shrink wrapped. Sprache: Englisch Gewicht in Gramm: 890.
