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9780306441752 - Scanning Electron Microscopy and X-ray Microanalysis: a Text for Biologists, Materials Scientists and Geologists by Goldstein, Joseph I ; Newbury, Dale E ; Echlin, ... (12 results)
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Hardcover. Condition: Good. Connecting readers with great books since 1972! Used textbooks may not include companion materials such as access codes, etc. May have some wear or writing/highlighting. We ship orders daily and Customer Service is our top priority!
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Hardcover. Condition: Good. No Jacket. Missing dust jacket; Pages can have notes/highlighting. Spine may show signs of wear. ~ ThriftBooks: Read More, Spend Less.
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Condition: Very Good. Hardcover, [xviii], 820 pages. Very Good condition in a Good dust jacket. Second edition. Size 10.25"x7.5". "The authors, emphasizing the practical aspects of the techniques described, discuss user-controlled functions of scanning electron microscope and electron microprobe electron optics, the characteristics of electron-specimen interactions, image formation and interpretation, and x-ray spectrometry." Book has moderate handling/shelfwear. Previous owner's name on front fly. Binding is tight. Text is clean and unmarked. Dust jacket has edgewear and sunned spine.
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Condition: Acceptable. SHIPS FAST. RESCUED + REPAIRED. Features a small coffee mishap, plus a reinforced binding, secured cover, and light annotations or highlighting-a durable, fully readable working copy brought back to life at a great value by our Book Sustainability Project. No access codes or CDs.
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Scanning Electron Microscopy and X-ray Microanalysis: A Text for Biologists, Materials Scientists and Geologists
Language: English
Published by Kluwer Academic / Plenum Publishers, 1992
ISBN 10: 0306441756 ISBN 13: 9780306441752
Condition: Good. Most items will be dispatched the same or the next working day. A copy that has been read but remains in clean condition. All of the pages are intact and the cover is intact and the spine may show signs of wear. The book may have minor markings which are not specifically mentioned.
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Hardcover. Condition: Near Fine. Dust Jacket Condition: Very Good. 2nd Edition. Hardback in near fine condition with a very good plus dust jacket. 2nd Edition.
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hardcover. Condition: As New.
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Hardcover. Condition: new. Excellent Condition.Excels in customer satisfaction, prompt replies, and quality checks.
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Jun 01, 1992. Condition: gebraucht; wie neu. Hardcover mit Schutzumschlag, dieser mit minimalen Standspuren, Buch selbst ist ungebraucht, 2. Auflage.
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Scanning Electron Microscopy and X-ray Microanalysis
Language: English
Published by Kluwer Academic Publishers Group, 1992
ISBN 10: 0306441756 ISBN 13: 9780306441752
Condition: Sehr gut. Zustand: Sehr gut | Seiten: 800 | Sprache: Englisch | Produktart: Bücher | Keine Beschreibung verfügbar.
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Condition: very_good. This books is in Very good condition. There may be a few flaws like shelf wear and some light wear.
