Order Total (1 Item Items):
Shipping Destination:
Zorian Yervant (98 results)
Skip to main search results
Search filters
Product Type
- All Product Types
- Books (98)
- Magazines & Periodicals (No further results match this refinement)
- Comics (No further results match this refinement)
- Sheet Music (No further results match this refinement)
- Art, Prints & Posters (No further results match this refinement)
- Photographs (No further results match this refinement)
- Maps (No further results match this refinement)
- Manuscripts & Paper Collectibles (No further results match this refinement)
Condition Learn more
- New (78)
- As New, Fine or Near Fine (14)
- Very Good or Good (5)
- Fair or Poor (1)
- As Described (No further results match this refinement)
Binding
Collectible Attributes
- First Edition (1)
- Signed (No further results match this refinement)
- Dust Jacket (No further results match this refinement)
- Seller-Supplied Images (38)
- Not Print on Demand (72)
Language (1)
Free Shipping
Seller Location
Seller Rating
-
Hardcover. Condition: Good. Connecting readers with great books since 1972! Used textbooks may not include companion materials such as access codes, etc. May have some wear or writing/highlighting. We ship orders daily and Customer Service is our top priority!
-
Hardcover. Condition: Good. No Jacket. Former library book; Pages can have notes/highlighting. Spine may show signs of wear. ~ ThriftBooks: Read More, Spend Less.
-
hardcover. Condition: Acceptable. Spend Less, Read More.
-
Hardcover. Condition: Near Fine. This book has mild rubbing and surface scratching to both covers, otherwise it is in excellent, like new condition with crisp, unmarked pages, a tight binding, and a strong, clean cover.
-
Principles of Testing Electronic Systems
Language: English
Published by Wiley & Sons, Incorporated, John, 2000
ISBN 10: 0471319317 ISBN 13: 9780471319313
Seller: Better World Books Ltd, Dunfermline, United Kingdom
Seller rating 5 out of 5 stars
First Edition
Condition: Good. 1st Edition. Ships from the UK. Former library book; may include library markings. Used book that is in clean, average condition without any missing pages.
-
-
-
Condition: As New. Unread book in perfect condition.
-
Collaboration and Technology: 21st International Conference, CRIWG 2015, Yerevan, Armenia, September 22-25, 2015, Proceedings (Information Systems and Applications, incl. Internet/Web, and HCI)
Book 41 of 58: Lecture Notes in Computer ScienceSeller: Ria Christie Collections, Uxbridge, United Kingdom
Seller rating 5 out of 5 stars
£ 44.30
£ 11.98 shipping
Ships from United Kingdom to U.S.A.Quantity: Over 20 available
Add to basketCondition: New. In.
-
-
Collaboration and Technology : 21st International Conference, Criwg 2015
Book 41 of 58: Lecture Notes in Computer ScienceSeller: GreatBookPricesUK, Woodford Green, United Kingdom
Seller rating 5 out of 5 stars
Condition: New.
-
Collaboration and Technology : 21st International Conference, Criwg 2015
Book 41 of 58: Lecture Notes in Computer ScienceSeller: GreatBookPricesUK, Woodford Green, United Kingdom
Seller rating 5 out of 5 stars
Condition: As New. Unread book in perfect condition.
-
Collaboration and Technology
Book 41 of 58: Lecture Notes in Computer ScienceLanguage: English
Published by Springer International Publishing AG, 2015
ISBN 10: 3319227467 ISBN 13: 9783319227467
Seller: Kennys Bookshop and Art Galleries Ltd., Galway, GY, Ireland
Seller rating 5 out of 5 stars
Condition: New. Editor(s): Baloian, Nelson; Zorian, Yervant; Taslakian, Perouz; Shoukouryan, Samvel. Series: Lecture Notes in Computer Science. Num Pages: 261 pages, 74 black & white illustrations, biography. BIC Classification: JNV; UBJ; UMZ; UNH; UYZG. Category: (P) Professional & Vocational. Dimension: 235 x 155 x 14. Weight in Grams: 409. . 2015. Paperback. . . . .
-
Collaboration and Technology
Book 41 of 58: Lecture Notes in Computer ScienceLanguage: English
Published by Springer International Publishing AG, 2015
ISBN 10: 3319227467 ISBN 13: 9783319227467
Condition: New. Editor(s): Baloian, Nelson; Zorian, Yervant; Taslakian, Perouz; Shoukouryan, Samvel. Series: Lecture Notes in Computer Science. Num Pages: 261 pages, 74 black & white illustrations, biography. BIC Classification: JNV; UBJ; UMZ; UNH; UYZG. Category: (P) Professional & Vocational. Dimension: 235 x 155 x 14. Weight in Grams: 409. . 2015. Paperback. . . . . Books ship from the US and Ireland.
-
Condition: New.
-
Condition: New.
-
-
-
Collaboration and Technology: 21st International Conference, Criwg 2015
Book 41 of 58: Lecture Notes in Computer ScienceLanguage: English
Published by Springer-Verlag New York Inc, 2015
ISBN 10: 3319227467 ISBN 13: 9783319227467
Paperback. Condition: Brand New. 264 pages. 9.25x6.10x0.60 inches. In Stock.
-
Collaboration and Technology
Book 41 of 58: Lecture Notes in Computer ScienceLanguage: English
Published by Springer International Publishing, Springer International Publishing Aug 2015, 2015
ISBN 10: 3319227467 ISBN 13: 9783319227467
Seller: buchversandmimpf2000, Emtmannsberg, BAYE, Germany
Seller rating 5 out of 5 stars
Taschenbuch. Condition: Neu. Neuware -This book constitutes the refereed proceedings of the 21st International Conference on Collaboration and Technology, CRIWG 2015, held in Yerevan, Armenia, in September 2015.The 19 revised papers presented together with 1 invited talk were carefully reviewed and selected from 28 submissions. CRIWG has been focused on collaboration technology design, development, and evaluation. The background research is influenced by a number of disciplines, such as computer science, management science, informationsystems, engineering, psychology, cognitive sciences, and social sciences.Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg 264 pp. Englisch.
-
Collaboration and Technology : 21st International Conference, CRIWG 2015, Yerevan, Armenia, September 22-25, 2015, Proceedings
Book 41 of 58: Lecture Notes in Computer ScienceLanguage: English
Published by Springer International Publishing, Springer International Publishing, 2015
ISBN 10: 3319227467 ISBN 13: 9783319227467
Taschenbuch. Condition: Neu. Druck auf Anfrage Neuware - Printed after ordering - This book constitutes the refereed proceedings of the 21st International Conference on Collaboration and Technology, CRIWG 2015, held in Yerevan, Armenia, in September 2015.The 19 revised papers presented together with 1 invited talk were carefully reviewed and selected from 28 submissions. CRIWG has been focused on collaboration technology design, development, and evaluation. The background research is influenced by a number of disciplines, such as computer science, management science, informationsystems, engineering, psychology, cognitive sciences, and social sciences.
-
Condition: New.
-
Multi-Chip Module Test Strategies (Frontiers in Electronic Testing, 7)
Book 2 of 40: Frontiers in Electronic TestingSeller: Ria Christie Collections, Uxbridge, United Kingdom
Seller rating 5 out of 5 stars
£ 94.30
£ 11.98 shipping
Ships from United Kingdom to U.S.A.Quantity: Over 20 available
Add to basketCondition: New. In.
-
On-Line Testing for VLSI (Frontiers in Electronic Testing)
Seller: Ria Christie Collections, Uxbridge, United Kingdom
Seller rating 5 out of 5 stars
£ 94.30
£ 11.98 shipping
Ships from United Kingdom to U.S.A.Quantity: Over 20 available
Add to basketCondition: New. In.
-
On Line-Testing for VLSI
Book 33 of 40: Frontiers in Electronic TestingSeller: Ria Christie Collections, Uxbridge, United Kingdom
Seller rating 5 out of 5 stars
£ 94.30
£ 11.98 shipping
Ships from United Kingdom to U.S.A.Quantity: Over 20 available
Add to basketCondition: New. In.
-
-
On Line-Testing for VLSI
Seller: GreatBookPricesUK, Woodford Green, United Kingdom
Seller rating 5 out of 5 stars
Condition: New.
-
Condition: New. pp. 164.
-
Condition: New. pp. 168.
-
On-line Testing for VLSI
Book 33 of 40: Frontiers in Electronic TestingLanguage: English
Published by Kluwer Academic Publishers, 1998
ISBN 10: 0792381327 ISBN 13: 9780792381327
Seller: Kennys Bookshop and Art Galleries Ltd., Galway, GY, Ireland
Seller rating 5 out of 5 stars
Condition: New. Test functions (fault detection, diagnosis, error correction, repair, and more) that are applied concurrently while the system continues its intended function are defined as on-line testing. This book contains a selected set of articles that discuss many of the modern aspects of on-line testing. Editor(s): Nicolaidis, Michael; Zorian, Yervant; Pradhan, Dhiraj K. Series: Frontiers in Electronic Testing. Num Pages: 164 pages, biography. BIC Classification: TJFD; UY. Category: (P) Professional & Vocational; (UP) Postgraduate, Research & Scholarly; (UU) Undergraduate. Dimension: 264 x 187 x 16. Weight in Grams: 520. . 1998. Reprinted from THE JOURNAL OF ELECTRONIC TESTING, Hardback. . . . .
