Published by Benjamin-Cummings Publishing Company, 1987
ISBN 10: 0805368507 ISBN 13: 9780805368505
Seller: ThriftBooks-Dallas, Dallas, TX, U.S.A.
Paperback. Condition: USED_VERYGOOD. No Jacket. May have limited writing in cover pages. Pages are unmarked. ~ ThriftBooks: Read More, Spend Less 1.6.
Published by Benjamin-Cummings Publishing Company, 1987
ISBN 10: 0805368507 ISBN 13: 9780805368505
Seller: ThriftBooks-Atlanta, AUSTELL, GA, U.S.A.
Paperback. Condition: USED_VERYGOOD. No Jacket. May have limited writing in cover pages. Pages are unmarked. ~ ThriftBooks: Read More, Spend Less 1.6.
Published by Kluwer, 1996
ISBN 10: 0792397142 ISBN 13: 9780792397144
Seller: Zubal-Books, Since 1961, Cleveland, OH, U.S.A.
Condition: USED_GOOD. 150 pp., Hardcover, ex library else text clean and binding tight. - If you are reading this, this item is actually (physically) in our stock and ready for shipment once ordered. We are not bookjackers. Buyer is responsible for any additional duties, taxes, or fees required by recipient's country.
Published by Springer, 1989
ISBN 10: 0792390547 ISBN 13: 9780792390541
Seller: Solr Books, Skokie, IL, U.S.A.
Condition: Good.
Kluwer Academic Publishers, Boston, 1996. 150 pages, Paperback--- - former library book in good condition - 468 Gramm.
Published by Springer, 1989
ISBN 10: 0792390547 ISBN 13: 9780792390541
Seller: BookDepart, Shepherdstown, WV, U.S.A.
Hardcover. Condition: Very Good. Hardcover; fading and light shelf wear to exterior; light fading to page edges; otherwise in very good condition with clean text, firm binding.
Published by Springer, 1996
ISBN 10: 0792397142 ISBN 13: 9780792397144
Seller: Basi6 International, Irving, TX, U.S.A.
Condition: Brand New. New. US edition. Expediting shipping for all USA and Europe orders excluding PO Box. Excellent Customer Service.
Published by Springer, 1996
ISBN 10: 0792397142 ISBN 13: 9780792397144
Seller: Romtrade Corp., STERLING HEIGHTS, MI, U.S.A.
Condition: New. This is a Brand-new US Edition. This Item may be shipped from US or any other country as we have multiple locations worldwide.
Kluwer, Boston, 1990. XII, 291 pages with some graphics, hardcover, (former library book)--- 750 Gramm.
Published by Springer US, 1996
ISBN 10: 0792397142 ISBN 13: 9780792397144
Seller: Buchpark, Trebbin, Germany
Condition: Sehr gut. Zustand: Sehr gut - Gepflegter, sauberer Zustand. Außen: verschmutzt. Aus der Auflösung einer renommierten Bibliothek. Kann Stempel beinhalten. | Seiten: 172 | Sprache: Englisch | Produktart: Bücher.
Published by Springer, 1996
ISBN 10: 0792397142 ISBN 13: 9780792397144
Seller: BennettBooksLtd, North Las Vegas, NV, U.S.A.
hardcover. Condition: New. In shrink wrap! Looks like an interesting title!.
Published by Kluwer Academic Publishers, 1989
ISBN 10: 0792390547 ISBN 13: 9780792390541
Seller: New Book Sale, London, United Kingdom
Hardcover. Condition: New. Usually Dispatched within 1-2 Business Days , Buy with confidence , excellent customer service.
Published by Springer, 1996
ISBN 10: 0792397142 ISBN 13: 9780792397144
Seller: booksXpress, Bayonne, NJ, U.S.A.
Hardcover. Condition: NEW.
Published by Springer, 1996
ISBN 10: 0792397142 ISBN 13: 9780792397144
Seller: Books Puddle, New York, NY, U.S.A.
Condition: Used. pp. 172.
Published by Springer, 1990
ISBN 10: 0792390547 ISBN 13: 9780792390541
Seller: Ammareal, Morangis, France
Hardcover. Condition: Très bon. Ancien livre de bibliothèque. Petite(s) trace(s) de pliure sur la couverture. Légères traces d'usure sur la couverture. Salissures sur la tranche. Edition 1990. Ammareal reverse jusqu'à 15% du prix net de cet article à des organisations caritatives. ENGLISH DESCRIPTION Book Condition: Used, Very good. Former library book. Slightly creased cover. Slight signs of wear on the cover. Stains on the edge. Edition 1990. Ammareal gives back up to 15% of this item's net price to charity organizations.
Published by Springer, 2011
ISBN 10: 146128595X ISBN 13: 9781461285953
Seller: GreatBookPrices, Columbia, MD, U.S.A.
Condition: New.
Published by Springer, 1996
ISBN 10: 0792397142 ISBN 13: 9780792397144
Seller: Majestic Books, Hounslow, United Kingdom
Condition: Used. pp. 172 52:B&W 6.14 x 9.21in or 234 x 156mm (Royal 8vo) Case Laminate on White w/Gloss Lam.
Published by The Benjamin/Cummings Publishing Company, Inc., 1987
ISBN 10: 0805368507 ISBN 13: 9780805368505
Seller: Anybook.com, Lincoln, United Kingdom
Condition: Poor. This is an ex-library book and may have the usual library/used-book markings inside.This book has soft covers. In poor condition, suitable as a reading copy.
Published by Springer, 1996
ISBN 10: 0792397142 ISBN 13: 9780792397144
Seller: GreatBookPrices, Columbia, MD, U.S.A.
Condition: As New. Unread book in perfect condition.
Published by Springer, 1996
ISBN 10: 0792397142 ISBN 13: 9780792397144
Seller: GreatBookPrices, Columbia, MD, U.S.A.
Condition: New.
Published by Springer, 1996
ISBN 10: 0792397142 ISBN 13: 9780792397144
Seller: GreatBookPricesUK, Castle Donington, DERBY, United Kingdom
Condition: New.
Published by Springer, 2011
ISBN 10: 146128595X ISBN 13: 9781461285953
Seller: GreatBookPricesUK, Castle Donington, DERBY, United Kingdom
Condition: New.
Published by Springer US Apr 1996, 1996
ISBN 10: 0792397142 ISBN 13: 9780792397144
Seller: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, Germany
Buch. Condition: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -Over the years there has been a large increase in the functionality available on a single integrated circuit. This has been mainly achieved by a continuous drive towards smaller feature sizes, larger dies, and better packing efficiency. However, this greater functionality has also resulted in substantial increases in the capital investment needed to build fabrication facilities. Given such a high level of investment, it is critical for IC manufacturers to reduce manufacturing costs and get a better return on their investment. The most obvious method of reducing the manufacturing cost per die is to improve manufacturing yield. Modern VLSI research and engineering (which includes design manufacturing and testing) encompasses a very broad range of disciplines such as chemistry, physics, material science, circuit design, mathematics and computer science. Due to this diversity, the VLSI arena has become fractured into a number of separate sub-domains with little or no interaction between them. This is the case with the relationships between testing and manufacturing. From Contamination to Defects, Faults and Yield Loss: Simulation and Applications focuses on the core of the interface between manufacturing and testing, i.e., the contamination-defect-fault relationship. The understanding of this relationship can lead to better solutions of many manufacturing and testing problems. Failure mechanism models are developed and presented which can be used to accurately estimate probability of different failures for a given IC. This information is critical in solving key yield-related applications such as failure analysis, fault modeling and design manufacturing. 172 pp. Englisch.
Published by Springer US, 2011
ISBN 10: 146128595X ISBN 13: 9781461285953
Seller: moluna, Greven, Germany
Condition: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Over the years there has been a large increase in the functionality available on a single integrated circuit. This has been mainly achieved by a continuous drive towards smaller feature sizes, larger dies, and better packing efficiency. However, this gre.
Published by Springer US, 1996
ISBN 10: 0792397142 ISBN 13: 9780792397144
Seller: moluna, Greven, Germany
Gebunden. Condition: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Over the years there has been a large increase in the functionality available on a single integrated circuit. This has been mainly achieved by a continuous drive towards smaller feature sizes, larger dies, and better packing efficiency. However, this gre.
Published by Springer US, 1996
ISBN 10: 0792397142 ISBN 13: 9780792397144
Seller: AHA-BUCH GmbH, Einbeck, Germany
Buch. Condition: Neu. Druck auf Anfrage Neuware - Printed after ordering - Over the years there has been a large increase in the functionality available on a single integrated circuit. This has been mainly achieved by a continuous drive towards smaller feature sizes, larger dies, and better packing efficiency. However, this greater functionality has also resulted in substantial increases in the capital investment needed to build fabrication facilities. Given such a high level of investment, it is critical for IC manufacturers to reduce manufacturing costs and get a better return on their investment. The most obvious method of reducing the manufacturing cost per die is to improve manufacturing yield. Modern VLSI research and engineering (which includes design manufacturing and testing) encompasses a very broad range of disciplines such as chemistry, physics, material science, circuit design, mathematics and computer science. Due to this diversity, the VLSI arena has become fractured into a number of separate sub-domains with little or no interaction between them. This is the case with the relationships between testing and manufacturing. From Contamination to Defects, Faults and Yield Loss: Simulation and Applications focuses on the core of the interface between manufacturing and testing, i.e., the contamination-defect-fault relationship. The understanding of this relationship can lead to better solutions of many manufacturing and testing problems. Failure mechanism models are developed and presented which can be used to accurately estimate probability of different failures for a given IC. This information is critical in solving key yield-related applications such as failure analysis, fault modeling and design manufacturing.
Published by Springer-Verlag New York Inc., 2011
ISBN 10: 146128595X ISBN 13: 9781461285953
Seller: Kennys Bookshop and Art Galleries Ltd., Galway, GY, Ireland
Condition: NEW. Series: Frontiers in Electronic Testing. Num Pages: 166 pages, biography. BIC Classification: THR; TJFC; UGC. Category: (P) Professional & Vocational. Dimension: 234 x 156 x 9. Weight in Grams: 272. . 2011. Softcover reprint of the original 1st ed. 1996. Paperback. . . . .
Published by Springer US, 2011
ISBN 10: 146128595X ISBN 13: 9781461285953
Seller: AHA-BUCH GmbH, Einbeck, Germany
Taschenbuch. Condition: Neu. Druck auf Anfrage Neuware - Printed after ordering - Over the years there has been a large increase in the functionality available on a single integrated circuit. This has been mainly achieved by a continuous drive towards smaller feature sizes, larger dies, and better packing efficiency. However, this greater functionality has also resulted in substantial increases in the capital investment needed to build fabrication facilities. Given such a high level of investment, it is critical for IC manufacturers to reduce manufacturing costs and get a better return on their investment. The most obvious method of reducing the manufacturing cost per die is to improve manufacturing yield. Modern VLSI research and engineering (which includes design manufacturing and testing) encompasses a very broad range of disciplines such as chemistry, physics, material science, circuit design, mathematics and computer science. Due to this diversity, the VLSI arena has become fractured into a number of separate sub-domains with little or no interaction between them. This is the case with the relationships between testing and manufacturing. From Contamination to Defects, Faults and Yield Loss: Simulation and Applications focuses on the core of the interface between manufacturing and testing, i.e., the contamination-defect-fault relationship. The understanding of this relationship can lead to better solutions of many manufacturing and testing problems. Failure mechanism models are developed and presented which can be used to accurately estimate probability of different failures for a given IC. This information is critical in solving key yield-related applications such as failure analysis, fault modeling and design manufacturing.
Published by Springer, 1996
ISBN 10: 0792397142 ISBN 13: 9780792397144
Seller: GreatBookPricesUK, Castle Donington, DERBY, United Kingdom
Condition: As New. Unread book in perfect condition.
Published by Kluwer Academic Publishers, 1996
ISBN 10: 0792397142 ISBN 13: 9780792397144
Seller: Kennys Bookshop and Art Galleries Ltd., Galway, GY, Ireland
Condition: NEW. States that over the years there has been a large increase in the functionality available on a single integrated circuit. This book focuses on the core of the interface between manufacturing and testing, ie, the contamination-defect-fault relationship. Series: Frontiers in Electronic Testing. Num Pages: 166 pages, biography. BIC Classification: TJFC; TJFD. Category: (P) Professional & Vocational; (XV) Technical / Manuals. Dimension: 234 x 156 x 11. Weight in Grams: 930. . 1996. Hardback. . . . .