Language: English
Published by New Delhi, Springer., 2015
ISBN 10: 8132221311 ISBN 13: 9788132221319
Seller: Universitätsbuchhandlung Herta Hold GmbH, Berlin, Germany
xiii, 113p. Hardcover. Versand aus Deutschland / We dispatch from Germany via Air Mail. Einband bestoßen, daher Mängelexemplar gestempelt, sonst sehr guter Zustand. Imperfect copy due to slightly bumped cover, apart from this in very good condition. Stamped. Stamped. Bumped.Little flexed. Sprache: Englisch.
Language: English
Published by Institution of Engineering & Technology, 2019
ISBN 10: 1839530537 ISBN 13: 9781839530531
Seller: Recycle Bookstore, San Jose, CA, U.S.A.
Hardcover. Condition: Near Fine. Book has light wear to the edges and corners, otherwise in near new condition.
paperback. Condition: Very Good.
Seller: SpringBooks, Berlin, Germany
First Edition
Hardcover. Condition: Very Good. 1. Auflage. unread, some shelfwear - will be dispatched immediately.
Language: English
Published by Springer-Verlag GmbH, 2021
ISBN 10: 9811579393 ISBN 13: 9789811579394
Seller: Homeless Books, Berlin, Germany
First Edition
Softcover. Condition: Wie neu. 1. Auflage. As good as new, unread book in perfect condition. Language - English. Ships from Berlin.
Condition: New.
Language: English
Published by The Institution of Engineering and Technology, 2019
ISBN 10: 1839530510 ISBN 13: 9781839530517
Seller: GreatBookPrices, Columbia, MD, U.S.A.
Condition: New.
Language: English
Published by The Institution of Engineering and Technology, 2019
ISBN 10: 1839530510 ISBN 13: 9781839530517
Seller: Lucky's Textbooks, Dallas, TX, U.S.A.
Condition: New.
Condition: Sehr gut. Zustand: Sehr gut | Sprache: Englisch | Produktart: Bücher | The book provides a detailed analysis of issues related to sub-threshold interconnect performance from the perspective of analytical approach and design techniques. Particular emphasis is laid on the performance analysis of coupling noise and variability issues in sub-threshold domain to develop efficient compact models. The proposed analytical approach gives physical insight of the parameters affecting the transient behavior of coupled interconnects. Remedial design techniques are also suggested to mitigate the effect of coupling noise. The effects of wire width, spacing between the wires, wire length are thoroughly investigated. In addition, the effect of parameters like driver strength on peak coupling noise has also been analyzed. Process, voltage and temperature variations are prominent factors affecting sub-threshold design and have also been investigated. The process variability analysis has been carried out using parametric analysis, process corner analysis and Monte Carlo technique. The book also provides a qualitative summary of the work reported in the literature by various researchers in the design of digital sub-threshold circuits. This book should be of interest for researchers and graduate students with deeper insights into sub-threshold interconnect models in particular. In this sense, this book will best fit as a text book and/or a reference book for students who are initiated in the area of research and advanced courses in nanotechnology, interconnect design and modeling.
Condition: Sehr gut. Zustand: Sehr gut | Sprache: Englisch | Produktart: Bücher | The book provides a detailed analysis of issues related to sub-threshold interconnect performance from the perspective of analytical approach and design techniques. Particular emphasis is laid on the performance analysis of coupling noise and variability issues in sub-threshold domain to develop efficient compact models. The proposed analytical approach gives physical insight of the parameters affecting the transient behavior of coupled interconnects. Remedial design techniques are also suggested to mitigate the effect of coupling noise. The effects of wire width, spacing between the wires, wire length are thoroughly investigated. In addition, the effect of parameters like driver strength on peak coupling noise has also been analyzed. Process, voltage and temperature variations are prominent factors affecting sub-threshold design and have also been investigated. The process variability analysis has been carried out using parametric analysis, process corner analysis and Monte Carlo technique. The book also provides a qualitative summary of the work reported in the literature by various researchers in the design of digital sub-threshold circuits. This book should be of interest for researchers and graduate students with deeper insights into sub-threshold interconnect models in particular. In this sense, this book will best fit as a text book and/or a reference book for students who are initiated in the area of research and advanced courses in nanotechnology, interconnect design and modeling.
Condition: As New. Unread book in perfect condition.
Seller: Ria Christie Collections, Uxbridge, United Kingdom
£ 92.99
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Seller: Ria Christie Collections, Uxbridge, United Kingdom
£ 94.30
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Seller: GreatBookPricesUK, Woodford Green, United Kingdom
Condition: New.
Language: English
Published by Institution of Engineering & Technology, 2019
ISBN 10: 1839530537 ISBN 13: 9781839530531
Seller: GreatBookPrices, Columbia, MD, U.S.A.
Condition: New.
Language: English
Published by The Institution of Engineering and Technology, 2019
ISBN 10: 1839530510 ISBN 13: 9781839530517
Seller: California Books, Miami, FL, U.S.A.
Condition: New.
Language: English
Published by Institution of Engineering & Technology, 2019
ISBN 10: 1839530537 ISBN 13: 9781839530531
Seller: California Books, Miami, FL, U.S.A.
Condition: New.
Language: English
Published by The Institution of Engineering and Technology, 2019
ISBN 10: 1839530510 ISBN 13: 9781839530517
Seller: GreatBookPrices, Columbia, MD, U.S.A.
Condition: As New. Unread book in perfect condition.
Language: English
Published by Institution of Engineering & Technology, 2019
ISBN 10: 1839530537 ISBN 13: 9781839530531
Seller: GreatBookPrices, Columbia, MD, U.S.A.
Condition: As New. Unread book in perfect condition.
Condition: new.
Condition: New. pp. 128 Softcover reprint of the original 1st ed. 2015 edition NO-PA16APR2015-KAP.
Language: English
Published by Institution of Engineering and Technology, GB, 2019
ISBN 10: 1839530510 ISBN 13: 9781839530517
Seller: Rarewaves USA, OSWEGO, IL, U.S.A.
Hardback. Condition: New. VLSI, or Very-Large-Scale-Integration, is the practice of combining billions of transistors to create an integrated circuit. At present, VLSI circuits are realised using CMOS technology. However, the demand for ever smaller, more efficient circuits is now pushing the limits of CMOS. Post-CMOS refers to the possible future digital logic technologies beyond the CMOS scaling limits. This 2-volume set addresses the current state of the art in VLSI technologies and presents potential options for post-CMOS processes. VLSI and Post-CMOS Electronics is a useful reference guide for researchers, engineers and advanced students working in the area of design and modelling of VLSI and post-CMOS devices and their circuits. Volume 1 focuses on design, modelling and simulation, including applications in low voltage and low power VLSI, and post-CMOS devices and circuits. Volume 2 addresses a wide range of devices, circuits and interconnects.
Language: English
Published by Institution of Engineering and Technology, GB, 2019
ISBN 10: 1839530537 ISBN 13: 9781839530531
Seller: Rarewaves USA, OSWEGO, IL, U.S.A.
Hardback. Condition: New. VLSI, or Very-Large-Scale-Integration, is the practice of combining billions of transistors to create an integrated circuit. At present, VLSI circuits are realised using CMOS technology. However, the demand for ever smaller, more efficient circuits is now pushing the limits of CMOS. Post-CMOS refers to the possible future digital logic technologies beyond the CMOS scaling limits. This 2-volume set addresses the current state of the art in VLSI technologies and presents potential options for post-CMOS processes. VLSI and Post-CMOS Electronics is a useful reference guide for researchers, engineers and advanced students working in the area of design and modelling of VLSI and post-CMOS devices and their circuits. Volume 1 focuses on design, modelling and simulation, including applications in low voltage and low power VLSI, and post-CMOS devices and circuits. Volume 2 addresses a wide range of devices, circuits and interconnects.
Seller: GreatBookPricesUK, Woodford Green, United Kingdom
£ 106.50
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Add to basketCondition: As New. Unread book in perfect condition.
Language: English
Published by The Institution of Engineering and Technology, 2019
ISBN 10: 1839530510 ISBN 13: 9781839530517
Seller: GreatBookPricesUK, Woodford Green, United Kingdom
£ 120.18
Quantity: Over 20 available
Add to basketCondition: As New. Unread book in perfect condition.
Language: English
Published by Institution of Engineering & Technology, 2019
ISBN 10: 1839530537 ISBN 13: 9781839530531
Seller: GreatBookPricesUK, Woodford Green, United Kingdom
£ 120.82
Quantity: Over 20 available
Add to basketCondition: As New. Unread book in perfect condition.
Language: English
Published by The Institution of Engineering and Technology, 2019
ISBN 10: 1839530510 ISBN 13: 9781839530517
Seller: Ria Christie Collections, Uxbridge, United Kingdom
£ 124.31
Quantity: Over 20 available
Add to basketCondition: New. In English.