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Short-Circuit Ruggedness of High-Voltage IGBTs

Arnost Kopta

ISBN 10: 3832293833 / ISBN 13: 9783832293833
Published by Shaker Verlag Okt 2010, 2010
New Condition: Neu Taschenbuch
From Agrios-Buch (Bergisch Gladbach, Germany)

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Neuware - One of the biggest advantages of the IGBT, is its inherent capability to limit the external current in case of a short-circuit event. Until now, the failure mechanism that limits the short-circuit capability of high voltage buffer-type IGBTs has not been fully understood. The experimental data show that the most common short-circuit failure type cannot be explained by any known failure mechanism such as cell latch-up, avalanche breakdown or thermal runaway. The goal of this thesis was to find the destruction mechanism that limits the short-circuit capability of the investigated high voltage IGBTs. This was achieved by using a combination of device simulations and experimental investigations of3.3kV, 4.5kV and 6.5kV IGBTs. 167 pp. Englisch. Bookseller Inventory # 9783832293833

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Bibliographic Details

Title: Short-Circuit Ruggedness of High-Voltage ...

Publisher: Shaker Verlag Okt 2010

Publication Date: 2010

Binding: Taschenbuch

Book Condition:Neu