Multi-Chip Module Test Strategies (Hardcover)
Yervant Zorian
Sold by Grand Eagle Retail, Bensenville, IL, U.S.A.
AbeBooks Seller since 12 October 2005
New - Hardcover
Condition: New
Quantity: 1 available
Add to basketSold by Grand Eagle Retail, Bensenville, IL, U.S.A.
AbeBooks Seller since 12 October 2005
Condition: New
Quantity: 1 available
Add to basketHardcover. Multi-chips modules (MCMs) in the late 1990s consist of complex and dense VLSI devices mounted into packages that allow little physical access to internal nodes. The complexity and cost associated with their test and diagnosis are major obstacles to their use. This volume of research presents updated test strategies for MCMs. It is designed for engineers interested in practical implementations of MCM test solutions and for designers seeking current test and design-for-testability solutions for their next designs. This volume of original research is designed for engineers interested in practical implementations of MCM test solutions and for designers looking for leading edge test and design-for-testability solutions for their next designs. Shipping may be from multiple locations in the US or from the UK, depending on stock availability.
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