Items related to Knowledge-Driven Board-Level Functional Fault Diagnosis

Knowledge-Driven Board-Level Functional Fault Diagnosis - Hardcover

 
9783319402093: Knowledge-Driven Board-Level Functional Fault Diagnosis

Synopsis

This book provides a comprehensive set of characterization, prediction, optimization, evaluation, and evolution techniques for a diagnosis system for fault isolation in large electronic systems. Readers with a background in electronics design or system engineering can use this book as a reference to derive insightful knowledge from data analysis and use this knowledge as guidance for designing reasoning-based diagnosis systems. Moreover, readers with a background in statistics or data analytics can use this book as a practical case study for adapting data mining and machine learning techniques to electronic system design and diagnosis. This book identifies the key challenges in reasoning-based, board-level diagnosis system design and presents the solutions and corresponding results that have emerged from leading-edge research in this domain. It covers topics ranging from highly accurate fault isolation, adaptive fault isolation, diagnosis-system robustness assessment, to system performance analysis and evaluation, knowledge discovery and knowledge transfer. With its emphasis on the above topics, the book provides an in-depth and broad view of reasoning-based fault diagnosis system design.

• Explains and applies optimized techniques from the machine-learning       domain to solve the fault diagnosis problem in the realm of electronic system design and manufacturing;
• Demonstrates techniques based on industrial data and feedback from an actual manufacturing line;
• Discusses practical problems, including diagnosis accuracy, diagnosis time cost, evaluation of diagnosis system, handling of missing syndromes in diagnosis, and need for fast diagnosis-system development.

"synopsis" may belong to another edition of this title.

About the Author

Fangming Ye is a Staff Engineer at Huawei Technologies, with particular research interests in machine learning, data mining, resilient system design, and diagnosis system for board-level faults.

Zhaobo Zhang is a Staff Engineer at Huawei Technologies, specializing in Data analysis and machine learning, Network reliability, Application design, Flow standardization, diagnosis automation, and memory test.

Krishnendu Chakrabarty is the William H. Younger Distinguished Professor of Engineering in the Department of Electrical and Computer Engineering and Professor of Computer Science at Duke University. He is a recipient of the National Science Foundation Early Faculty (CAREER) award, the Office of Naval Research Young Investigator award, the Humboldt Research Award from the Alexander von Humboldt Foundation, Germany, the IEEE Transactions on CAD Donald O. Pederson Best Paper award (2015), and 11 best paper awards at major IEEE conferences. Heis also a recipient of the IEEE Computer Society Technical Achievement Award (2015) and the Distinguished Alumnus Award from the Indian Institute of Technology, Kharagpur (2014). Prof. Chakrabarty is a Hans Fischer Senior Fellow at the Institute for Advanced Studies, Technical University of Munich, Germany.

Prof. Chakrabarty’s current research projects include: testing and design-for-testability of integrated circuits and system; digital microfluidics, biochips, and cyberphysical systems; optimization of enterprise systems and smart manufacturing. He is a Fellow of ACM, a Fellow of IEEE, and a Golden Core Member of the IEEE Computer Society. Prof. Chakrabarty served as the Editor-in-Chief of IEEE Design & Test of Computers during 2010-2012 and ACM Journal on Emerging Technologies in Computing Systems during 2010-2015. Currently he serves as the Editor-in-Chief of IEEE Transactions on VLSI Systems

Xinli Gu is a Senior Director at Huawei Technologies, where he leads design solution for network product quality and reliability. He also had 12-year experiences with Cisco Systems, responsible for product testability and manufacturing quality at corporate level. 

From the Back Cover

This book provides a comprehensive set of characterization, prediction, optimization, evaluation, and evolution techniques for a diagnosis system for fault isolation in large electronic systems. Readers with a background in electronics design or system engineering can use this book as a reference to derive insightful knowledge from data analysis and use this knowledge as guidance for designing reasoning-based diagnosis systems. Moreover, readers with a background in statistics or data analytics can use this book as a practical case study for adapting data mining and machine learning techniques to electronic system design and diagnosis. This book identifies the key challenges in reasoning-based, board-level diagnosis system design and presents the solutions and corresponding results that have emerged from leading-edge research in this domain. It covers topics ranging from highly accurate fault isolation, adaptive fault isolation, diagnosis-system robustness assessment, to system performance analysis and evaluation, knowledge discovery and knowledge transfer. With its emphasis on the above topics, the book provides an in-depth and broad view of reasoning-based fault diagnosis system design.

• Explains and applies optimized techniques from the machine-learning       domain to solve the fault diagnosis problem in the realm of electronic system design and manufacturing;
• Demonstrates techniques based on industrial data and feedback from an actual manufacturing line;
• Discusses practical problems, including diagnosis accuracy, diagnosis time cost, evaluation of diagnosis system, handling of missing syndromes in diagnosis, and need for fast diagnosis-system development.


"About this title" may belong to another edition of this title.

  • PublisherSpringer
  • Publication date2016
  • ISBN 10 3319402099
  • ISBN 13 9783319402093
  • BindingHardcover
  • LanguageEnglish
  • Edition number1
  • Number of pages160

Buy Used

Condition: Fine
Zustand: Sehr gut | Seiten: 164...
View this item

£ 7.58 shipping from Germany to United Kingdom

Destination, rates & speeds

Other Popular Editions of the Same Title

9783319820545: Knowledge-Driven Board-Level Functional Fault Diagnosis

Featured Edition

ISBN 10:  3319820540 ISBN 13:  9783319820545
Publisher: Springer, 2018
Softcover

Search results for Knowledge-Driven Board-Level Functional Fault Diagnosis

Stock Image

Fangming Ye, Xinli Gu, Krishnendu Chakrabarty, Zhaobo Zhang
ISBN 10: 3319402099 ISBN 13: 9783319402093
Used Hardcover

Seller: Buchpark, Trebbin, Germany

Seller rating 5 out of 5 stars 5-star rating, Learn more about seller ratings

Condition: Sehr gut. Zustand: Sehr gut | Seiten: 164 | Sprache: Englisch | Produktart: Bücher. Seller Inventory # 26812054/12

Contact seller

Buy Used

£ 54.62
Convert currency
Shipping: £ 7.58
From Germany to United Kingdom
Destination, rates & speeds

Quantity: 1 available

Add to basket

Seller Image

Ye, Fangming; Zhang, Zhaobo; Chakrabarty, Krishnendu; Gu, Xinli
Published by Springer, 2016
ISBN 10: 3319402099 ISBN 13: 9783319402093
New Hardcover

Seller: GreatBookPricesUK, Woodford Green, United Kingdom

Seller rating 5 out of 5 stars 5-star rating, Learn more about seller ratings

Condition: New. Seller Inventory # 26396656-n

Contact seller

Buy New

£ 71.61
Convert currency
Shipping: FREE
Within United Kingdom
Destination, rates & speeds

Quantity: Over 20 available

Add to basket

Stock Image

Ye, Fangming; Zhang, Zhaobo; Chakrabarty, Krishnendu; Gu, Xinli
Published by Springer, 2016
ISBN 10: 3319402099 ISBN 13: 9783319402093
New Hardcover

Seller: Ria Christie Collections, Uxbridge, United Kingdom

Seller rating 5 out of 5 stars 5-star rating, Learn more about seller ratings

Condition: New. In. Seller Inventory # ria9783319402093_new

Contact seller

Buy New

£ 71.62
Convert currency
Shipping: FREE
Within United Kingdom
Destination, rates & speeds

Quantity: Over 20 available

Add to basket

Seller Image

Ye, Fangming; Zhang, Zhaobo; Chakrabarty, Krishnendu; Gu, Xinli
Published by Springer, 2016
ISBN 10: 3319402099 ISBN 13: 9783319402093
Used Hardcover

Seller: GreatBookPricesUK, Woodford Green, United Kingdom

Seller rating 5 out of 5 stars 5-star rating, Learn more about seller ratings

Condition: As New. Unread book in perfect condition. Seller Inventory # 26396656

Contact seller

Buy Used

£ 77.90
Convert currency
Shipping: FREE
Within United Kingdom
Destination, rates & speeds

Quantity: Over 20 available

Add to basket

Seller Image

Fangming Ye
ISBN 10: 3319402099 ISBN 13: 9783319402093
New Hardcover
Print on Demand

Seller: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, Germany

Seller rating 5 out of 5 stars 5-star rating, Learn more about seller ratings

Buch. Condition: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -This book provides a comprehensive set of characterization, prediction, optimization, evaluation, and evolution techniques for a diagnosis system for fault isolation in large electronic systems. Readers with a background in electronics design or system engineering can use this book as a reference to derive insightful knowledge from data analysis and use this knowledge as guidance for designing reasoning-based diagnosis systems. Moreover, readers with a background in statistics or data analytics can use this book as a practical case study for adapting data mining and machine learning techniques to electronic system design and diagnosis. This book identifies the key challenges in reasoning-based, board-level diagnosis system design and presents the solutions and corresponding results that have emerged from leading-edge research in this domain. It covers topics ranging from highly accurate fault isolation, adaptive fault isolation, diagnosis-system robustness assessment, to system performance analysis and evaluation, knowledge discovery and knowledge transfer. With its emphasis on the above topics, the book provides an in-depth and broad view of reasoning-based fault diagnosis system design.-Explains and applies optimized techniques from the machine-learning domain to solve the fault diagnosis problem in the realm of electronic system design and manufacturing;-Demonstrates techniques based on industrial data and feedback from an actual manufacturing line;-Discusses practical problems, including diagnosis accuracy, diagnosis time cost, evaluation of diagnosis system, handling of missing syndromes in diagnosis, and need for fast diagnosis-system development. 164 pp. Englisch. Seller Inventory # 9783319402093

Contact seller

Buy New

£ 81.63
Convert currency
Shipping: £ 9.37
From Germany to United Kingdom
Destination, rates & speeds

Quantity: 2 available

Add to basket

Seller Image

Fangming Ye|Zhaobo Zhang|Krishnendu Chakrabarty|Xinli Gu
ISBN 10: 3319402099 ISBN 13: 9783319402093
New Hardcover
Print on Demand

Seller: moluna, Greven, Germany

Seller rating 5 out of 5 stars 5-star rating, Learn more about seller ratings

Condition: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Explains and applies optimized techniques from the machine-learning domain to solve the fault diagnosis problem in the realm of electronic system design and manufacturingDemonstrates techniques based on industrial data and feedback from an actual . Seller Inventory # 121774903

Contact seller

Buy New

£ 70.92
Convert currency
Shipping: £ 21.28
From Germany to United Kingdom
Destination, rates & speeds

Quantity: Over 20 available

Add to basket

Seller Image

Ye, Fangming; Zhang, Zhaobo; Chakrabarty, Krishnendu; Gu, Xinli
Published by Springer, 2016
ISBN 10: 3319402099 ISBN 13: 9783319402093
Used Hardcover

Seller: GreatBookPrices, Columbia, MD, U.S.A.

Seller rating 5 out of 5 stars 5-star rating, Learn more about seller ratings

Condition: As New. Unread book in perfect condition. Seller Inventory # 26396656

Contact seller

Buy Used

£ 78.38
Convert currency
Shipping: £ 14.73
From U.S.A. to United Kingdom
Destination, rates & speeds

Quantity: Over 20 available

Add to basket

Seller Image

Fangming Ye
ISBN 10: 3319402099 ISBN 13: 9783319402093
New Hardcover

Seller: AHA-BUCH GmbH, Einbeck, Germany

Seller rating 5 out of 5 stars 5-star rating, Learn more about seller ratings

Buch. Condition: Neu. Druck auf Anfrage Neuware - Printed after ordering - This book provides a comprehensive set of characterization, prediction, optimization, evaluation, and evolution techniques for a diagnosis system for fault isolation in large electronic systems. Readers with a background in electronics design or system engineering can use this book as a reference to derive insightful knowledge from data analysis and use this knowledge as guidance for designing reasoning-based diagnosis systems. Moreover, readers with a background in statistics or data analytics can use this book as a practical case study for adapting data mining and machine learning techniques to electronic system design and diagnosis. This book identifies the key challenges in reasoning-based, board-level diagnosis system design and presents the solutions and corresponding results that have emerged from leading-edge research in this domain. It covers topics ranging from highly accurate fault isolation, adaptive fault isolation, diagnosis-system robustness assessment, to system performance analysis and evaluation, knowledge discovery and knowledge transfer. With its emphasis on the above topics, the book provides an in-depth and broad view of reasoning-based fault diagnosis system design.-Explains and applies optimized techniques from the machine-learning domain to solve the fault diagnosis problem in the realm of electronic system design and manufacturing;-Demonstrates techniques based on industrial data and feedback from an actual manufacturing line;-Discusses practical problems, including diagnosis accuracy, diagnosis time cost, evaluation of diagnosis system, handling of missing syndromes in diagnosis, and need for fast diagnosis-system development. Seller Inventory # 9783319402093

Contact seller

Buy New

£ 81.63
Convert currency
Shipping: £ 11.91
From Germany to United Kingdom
Destination, rates & speeds

Quantity: 1 available

Add to basket

Seller Image

Ye, Fangming; Zhang, Zhaobo; Chakrabarty, Krishnendu; Gu, Xinli
Published by Springer, 2016
ISBN 10: 3319402099 ISBN 13: 9783319402093
New Hardcover

Seller: GreatBookPrices, Columbia, MD, U.S.A.

Seller rating 5 out of 5 stars 5-star rating, Learn more about seller ratings

Condition: New. Seller Inventory # 26396656-n

Contact seller

Buy New

£ 80.78
Convert currency
Shipping: £ 14.73
From U.S.A. to United Kingdom
Destination, rates & speeds

Quantity: Over 20 available

Add to basket

Stock Image

Ye, Fangming; Zhang, Zhaobo; Chakrabarty, Krishnendu; Gu, Xinli
Published by Springer, 2016
ISBN 10: 3319402099 ISBN 13: 9783319402093
New Hardcover

Seller: California Books, Miami, FL, U.S.A.

Seller rating 5 out of 5 stars 5-star rating, Learn more about seller ratings

Condition: New. Seller Inventory # I-9783319402093

Contact seller

Buy New

£ 98.69
Convert currency
Shipping: £ 7.37
From U.S.A. to United Kingdom
Destination, rates & speeds

Quantity: Over 20 available

Add to basket

There are 6 more copies of this book

View all search results for this book