Electrical Characterization of Silicon-on-Insulator Materials and Devices - Softcover

Cristoloveanu, Sorin; Li, Sheng

 
9781461522461: Electrical Characterization of Silicon-on-Insulator Materials and Devices
Softcover
ISBN 10: 1461522463 ISBN 13: 9781461522461
Publisher: Springer, 2011

This specific ISBN edition is currently not available.

Synopsis

1. Introduction. 2. Methods of Forming SOI Wafers. 3. SOI Devices. 4. Wafer Screening Techniques. 5. Transport Measurements. 6. SUS Capacitor Based Characterization Techniques. 7. Diode Measurements. 8. Transistor Characteristics. 9. Transistor Based Characterization Techniques. 10. Monitoring the Transistor Degradation. Index.

"synopsis" may belong to another edition of this title.

Publisher
Springer
Publication date
2011
Language
English
ISBN 10 
1461522463
ISBN 13 
9781461522461
Binding
Paperback

Other Popular Editions of the Same Title

9780792395485: Electrical Characterization of Silicon-on-Insulator Materials and Devices: 305 (The Springer International Series in Engineering and Computer Science, 305)

Featured Edition

ISBN 10:  0792395484 ISBN 13:  9780792395485
Publisher: Springer, 1995
Hardcover