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Advances in X-Ray Analysis: Volume 35B
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Advances in X-Ray Analysis: Volume 35B
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Advances in X-Ray Analysis : Volume 35B
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Advances in X-Ray Analysis
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Taschenbuch. Condition: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -Whole Pattern Fitting, Rietveld Analysis, and Calculated Diffraction Patterns. Quantitative Phase Analysis by XRay Diffraction (XRD). Thin Film and Surface Characterization by XRD. Lattice Defects and XRay Topography. Texture Analysis by XRD. XRD Instrumentation, Techniques, and Reference Materials. Stress Determination by Diffraction Methods. XRD Profile Fitting, Crystallite Size and Strain Determination. XRD Applications: Detection Limits, Superconductors, Organics, Minerals. Mathematical Methods in XRay Spectrometry (XRS). Thin Film and Surface Characterization by XRS and XPS. Total Reflection XRS. XRS Techniques and Instrumentation. XRS Applications. XRay Imaging and Tomography. 161 articles. Index. 648 pp. Englisch. Seller Inventory # 9781461365327
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Advances in X-Ray Analysis
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Advances in X-Ray Analysis
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Condition: New. Print on Demand pp. 648 67:B&W 6.69 x 9.61 in or 244 x 170 mm (Pinched Crown) Perfect Bound on White w/Gloss Lam. Seller Inventory # 51014941
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Advances in X-Ray Analysis: Volume 35B
Published by
Springer-Verlag New York Inc., 2012
ISBN 10: 1461365325
ISBN 13: 9781461365327
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Advances in X-Ray Analysis
Print on DemandSeller: Biblios, Frankfurt am main, HESSE, Germany
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Condition: New. PRINT ON DEMAND pp. 648. Seller Inventory # 1858577608
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Advances in X-Ray Analysis
Print on DemandSeller: moluna, Greven, Germany
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Condition: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Whole Pattern Fitting, Rietveld Analysis, and Calculated Diffraction Patterns. Quantitative Phase Analysis by XRay Diffraction (XRD). Thin Film and Surface Characterization by XRD. Lattice Defects and XRay Topography. Texture Analysis by XRD. XRD Instrum. Seller Inventory # 4194709
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Advances in X-Ray Analysis
Published by
Springer US, Springer New York Nov 2012, 2012
ISBN 10: 1461365325
ISBN 13: 9781461365327
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Taschenbuch
Seller: buchversandmimpf2000, Emtmannsberg, BAYE, Germany
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Taschenbuch. Condition: Neu. Neuware -Whole Pattern Fitting, Rietveld Analysis, and Calculated Diffraction Patterns. Quantitative Phase Analysis by XRay Diffraction (XRD). Thin Film and Surface Characterization by XRD. Lattice Defects and XRay Topography. Texture Analysis by XRD. XRD Instrumentation, Techniques, and Reference Materials. Stress Determination by Diffraction Methods. XRD Profile Fitting, Crystallite Size and Strain Determination. XRD Applications: Detection Limits, Superconductors, Organics, Minerals. Mathematical Methods in XRay Spectrometry (XRS). Thin Film and Surface Characterization by XRS and XPS. Total Reflection XRS. XRS Techniques and Instrumentation. XRS Applications. XRay Imaging and Tomography. 161 articles. Index.Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg 648 pp. Englisch. Seller Inventory # 9781461365327