Items related to IDDQ Testing of VLSI Circuits

IDDQ Testing of VLSI Circuits ISBN 13: 9781461363774

IDDQ Testing of VLSI Circuits - Softcover

 
9781461363774: IDDQ Testing of VLSI Circuits

Synopsis

Power supply current monitoring to detect CMOS IC defects during production testing quietly laid down its roots in the mid-1970s. Both Sandia Labs and RCA in the United States and Philips Labs in the Netherlands practiced this procedure on their CMOS ICs. At that time, this practice stemmed simply from an intuitive sense that CMOS ICs showing abnormal quiescent power supply current (IDDQ) contained defects. Later, this intuition was supported by data and analysis in the 1980s by Levi (RACD, Malaiya and Su (SUNY-Binghamton), Soden and Hawkins (Sandia Labs and the University of New Mexico), Jacomino and co-workers (Laboratoire d'Automatique de Grenoble), and Maly and co-workers (Carnegie Mellon University). Interest in IDDQ testing has advanced beyond the data reported in the 1980s and is now focused on applications and evaluations involving larger volumes of ICs that improve quality beyond what can be achieved by previous conventional means. In the conventional style of testing one attempts to propagate the logic states of the suspended nodes to primary outputs. This is done for all or most nodes of the circuit. For sequential circuits, in particular, the complexity of finding suitable tests is very high. In comparison, the IDDQ test does not observe the logic states, but measures the integrated current that leaks through all gates. In other words, it is like measuring a patient's temperature to determine the state of health. Despite perceived advantages, during the years that followed its initial announcements, skepticism about the practicality of IDDQ testing prevailed. The idea, however, provided a great opportunity to researchers. New results on test generation, fault simulation, design for testability, built-in self-test, and diagnosis for this style of testing have since been reported. After a decade of research, we are definitely closer to practice.

"synopsis" may belong to another edition of this title.

Buy Used

Condition: As New
Unread book in perfect condition...
View this item

£ 1.96 shipping within U.S.A.

Destination, rates & speeds

Other Popular Editions of the Same Title

9780792393153: IDDQ Testing of VLSI Circuits (Kluwer International Series in Engineering & Computer Science)

Featured Edition

ISBN 10:  0792393155 ISBN 13:  9780792393153
Publisher: Springer, 1992
Hardcover

Search results for IDDQ Testing of VLSI Circuits

Stock Image

Published by Springer, 2012
ISBN 10: 1461363772 ISBN 13: 9781461363774
New Softcover

Seller: Best Price, Torrance, CA, U.S.A.

Seller rating 5 out of 5 stars 5-star rating, Learn more about seller ratings

Condition: New. SUPER FAST SHIPPING. Seller Inventory # 9781461363774

Contact seller

Buy New

£ 83.63
Convert currency
Shipping: £ 6.66
Within U.S.A.
Destination, rates & speeds

Quantity: 1 available

Add to basket

Seller Image

Gulati, Ravi K. (EDT); Hawkins, Charles F. (EDT)
Published by Springer, 2012
ISBN 10: 1461363772 ISBN 13: 9781461363774
New Softcover

Seller: GreatBookPrices, Columbia, MD, U.S.A.

Seller rating 5 out of 5 stars 5-star rating, Learn more about seller ratings

Condition: New. Seller Inventory # 20368669-n

Contact seller

Buy New

£ 88.47
Convert currency
Shipping: £ 1.96
Within U.S.A.
Destination, rates & speeds

Quantity: 15 available

Add to basket

Stock Image

Published by Springer, 2012
ISBN 10: 1461363772 ISBN 13: 9781461363774
New Softcover

Seller: Lucky's Textbooks, Dallas, TX, U.S.A.

Seller rating 5 out of 5 stars 5-star rating, Learn more about seller ratings

Condition: New. Seller Inventory # ABLIING23Mar2716030032988

Contact seller

Buy New

£ 88.69
Convert currency
Shipping: £ 2.96
Within U.S.A.
Destination, rates & speeds

Quantity: Over 20 available

Add to basket

Stock Image

Ravi K. Gulati
ISBN 10: 1461363772 ISBN 13: 9781461363774
New Paperback

Seller: Grand Eagle Retail, Mason, OH, U.S.A.

Seller rating 5 out of 5 stars 5-star rating, Learn more about seller ratings

Paperback. Condition: new. Paperback. Power supply current monitoring to detect CMOS IC defects during production testing quietly laid down its roots in the mid-1970s. Both Sandia Labs and RCA in the United States and Philips Labs in the Netherlands practiced this procedure on their CMOS ICs. At that time, this practice stemmed simply from an intuitive sense that CMOS ICs showing abnormal quiescent power supply current (IDDQ) contained defects. Later, this intuition was supported by data and analysis in the 1980s by Levi (RACD, Malaiya and Su (SUNY-Binghamton), Soden and Hawkins (Sandia Labs and the University of New Mexico), Jacomino and co-workers (Laboratoire d'Automatique de Grenoble), and Maly and co-workers (Carnegie Mellon University). Interest in IDDQ testing has advanced beyond the data reported in the 1980s and is now focused on applications and evaluations involving larger volumes of ICs that improve quality beyond what can be achieved by previous conventional means. In the conventional style of testing one attempts to propagate the logic states of the suspended nodes to primary outputs. This is done for all or most nodes of the circuit. For sequential circuits, in particular, the complexity of finding suitable tests is very high. In comparison, the IDDQ test does not observe the logic states, but measures the integrated current that leaks through all gates. In other words, it is like measuring a patient's temperature to determine the state of health. Despite perceived advantages, during the years that followed its initial announcements, skepticism about the practicality of IDDQ testing prevailed. The idea, however, provided a great opportunity to researchers. New results on test generation, fault simulation, design for testability, built-in self-test, and diagnosis for this style of testing have since been reported. After a decade of research, we are definitely closer to practice. Power supply current monitoring to detect CMOS IC defects during production testing quietly laid down its roots in the mid-1970s. New results on test generation, fault simulation, design for testability, built-in self-test, and diagnosis for this style of testing have since been reported. Shipping may be from multiple locations in the US or from the UK, depending on stock availability. Seller Inventory # 9781461363774

Contact seller

Buy New

£ 91.72
Convert currency
Shipping: FREE
Within U.S.A.
Destination, rates & speeds

Quantity: 1 available

Add to basket

Stock Image

Published by Springer, 2012
ISBN 10: 1461363772 ISBN 13: 9781461363774
New Softcover

Seller: Ria Christie Collections, Uxbridge, United Kingdom

Seller rating 5 out of 5 stars 5-star rating, Learn more about seller ratings

Condition: New. In. Seller Inventory # ria9781461363774_new

Contact seller

Buy New

£ 94.13
Convert currency
Shipping: £ 11.98
From United Kingdom to U.S.A.
Destination, rates & speeds

Quantity: Over 20 available

Add to basket

Seller Image

Gulati, Ravi K. (EDT); Hawkins, Charles F. (EDT)
Published by Springer, 2012
ISBN 10: 1461363772 ISBN 13: 9781461363774
Used Softcover

Seller: GreatBookPrices, Columbia, MD, U.S.A.

Seller rating 5 out of 5 stars 5-star rating, Learn more about seller ratings

Condition: As New. Unread book in perfect condition. Seller Inventory # 20368669

Contact seller

Buy Used

£ 105.03
Convert currency
Shipping: £ 1.96
Within U.S.A.
Destination, rates & speeds

Quantity: 15 available

Add to basket

Seller Image

Gulati, Ravi K.|Hawkins, Charles F.
Published by Springer US, 2012
ISBN 10: 1461363772 ISBN 13: 9781461363774
New Softcover
Print on Demand

Seller: moluna, Greven, Germany

Seller rating 4 out of 5 stars 4-star rating, Learn more about seller ratings

Condition: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Power supply current monitoring to detect CMOS IC defects during production testing quietly laid down its roots in the mid-1970s. Both Sandia Labs and RCA in the United States and Philips Labs in the Netherlands practiced this procedure on their CMOS ICs. Seller Inventory # 4194563

Contact seller

Buy New

£ 82.79
Convert currency
Shipping: £ 42.67
From Germany to U.S.A.
Destination, rates & speeds

Quantity: Over 20 available

Add to basket

Seller Image

Charles F. Hawkins
Published by Springer US Okt 2012, 2012
ISBN 10: 1461363772 ISBN 13: 9781461363774
New Taschenbuch
Print on Demand

Seller: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, Germany

Seller rating 5 out of 5 stars 5-star rating, Learn more about seller ratings

Taschenbuch. Condition: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -Power supply current monitoring to detect CMOS IC defects during production testing quietly laid down its roots in the mid-1970s. Both Sandia Labs and RCA in the United States and Philips Labs in the Netherlands practiced this procedure on their CMOS ICs. At that time, this practice stemmed simply from an intuitive sense that CMOS ICs showing abnormal quiescent power supply current (IDDQ) contained defects. Later, this intuition was supported by data and analysis in the 1980s by Levi (RACD, Malaiya and Su (SUNY-Binghamton), Soden and Hawkins (Sandia Labs and the University of New Mexico), Jacomino and co-workers (Laboratoire d'Automatique de Grenoble), and Maly and co-workers (Carnegie Mellon University). Interest in IDDQ testing has advanced beyond the data reported in the 1980s and is now focused on applications and evaluations involving larger volumes of ICs that improve quality beyond what can be achieved by previous conventional means. In the conventional style of testing one attempts to propagate the logic states of the suspended nodes to primary outputs. This is done for all or most nodes of the circuit. For sequential circuits, in particular, the complexity of finding suitable tests is very high. In comparison, the IDDQ test does not observe the logic states, but measures the integrated current that leaks through all gates. In other words, it is like measuring a patient's temperature to determine the state of health. Despite perceived advantages, during the years that followed its initial announcements, skepticism about the practicality of IDDQ testing prevailed. The idea, however, provided a great opportunity to researchers. New results on test generation, fault simulation, design for testability, built-in self-test, and diagnosis for this style of testing have since been reported. After a decade of research, we are definitely closer to practice. 132 pp. Englisch. Seller Inventory # 9781461363774

Contact seller

Buy New

£ 105.56
Convert currency
Shipping: £ 20.03
From Germany to U.S.A.
Destination, rates & speeds

Quantity: 2 available

Add to basket

Stock Image

Published by Springer, 2012
ISBN 10: 1461363772 ISBN 13: 9781461363774
New Softcover

Seller: Books Puddle, New York, NY, U.S.A.

Seller rating 4 out of 5 stars 4-star rating, Learn more about seller ratings

Condition: New. pp. 132. Seller Inventory # 2697846033

Contact seller

Buy New

£ 122.89
Convert currency
Shipping: £ 2.96
Within U.S.A.
Destination, rates & speeds

Quantity: 4 available

Add to basket

Stock Image

Published by Springer, 2012
ISBN 10: 1461363772 ISBN 13: 9781461363774
New Softcover
Print on Demand

Seller: Majestic Books, Hounslow, United Kingdom

Seller rating 5 out of 5 stars 5-star rating, Learn more about seller ratings

Condition: New. Print on Demand pp. 132 66:B&W 7 x 10 in or 254 x 178 mm Perfect Bound on White w/Gloss Lam. Seller Inventory # 94551246

Contact seller

Buy New

£ 128.86
Convert currency
Shipping: £ 6.50
From United Kingdom to U.S.A.
Destination, rates & speeds

Quantity: 4 available

Add to basket

There are 6 more copies of this book

View all search results for this book