Defect Oriented Testing for CMOS Analog and Digital Circuits: v. 10 (Frontiers in Electronic Testing) - Hardcover

Book 39 of 40: Frontiers in Electronic Testing

Sachdev, Manoj

 
9780792380832: Defect Oriented Testing for CMOS Analog and Digital Circuits: v. 10 (Frontiers in Electronic Testing)

Synopsis

Defect-oriented testing methods have come a long way from a mere interesting academic exercise to a hard industrial reality, and many factors have contributed to their industrial acceptance. Traditional approaches of testing modern integrated circuits (ICs) have been found to be inadequate in terms of quality and economics of test. In a globally competitive semiconductor market-place, overall product quality and economics have become very important objectives. In addition, electronic systems are becoming increasingly complex, and demand components of the highest possible quality. Testing in general, and defect-oriented testing in particular, help in realizing these objectives. Providing a detailed overview of the subject, this book is intended for design and test professionals as well as researchers and students working in the field.

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Other Popular Editions of the Same Title

9781475749274: Defect Oriented Testing for CMOS Analog and Digital Circuits

Featured Edition

ISBN 10:  1475749279 ISBN 13:  9781475749274
Publisher: Springer, 2013
Softcover