Digital Communications Test and Measurement: High-Speed Physical Layer Characterization (Modern Simiconductor Design) - Hardcover

Derickson, Dennis; M�ller, Marcus

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9780132209106: Digital Communications Test and Measurement: High-Speed Physical Layer Characterization (Modern Simiconductor Design)

Hardcover

ISBN 10: 0132209101 ISBN 13: 9780132209106

Publisher: Prentice Hall, 2007

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A Comprehensive Guide to Physical Layer Test and Measurement of Digital Communication Links

Today's new data communication and computer interconnection systems run at unprecedented speeds, presenting new challenges not only in the design, but also in troubleshooting, test, and measurement. This book assembles contributions from practitioners at top test and measurement companies, component manufacturers,and universities. It brings together information that has never been broadly accessible before―information that was previously buried in application notes, seminar and conference presentations, short courses, and unpublished works.

Readers will gain a thorough understanding of the inner workings of digital high-speed systems, and learn how the different aspects of such systems can be tested. The editors and contributors cover key areas in test and measurement of transmitters (digital waveform and jitter analysis and bit error ratio), receivers (sensitivity, jitter tolerance, and PLL/CDR characterization), and high-speed channel characterization (in time and frequency domain). Extensive illustrations are provided throughout.

Coverage includes

Signal integrity from a measurement point of view

Digital waveform analysis using high bandwidth real-time and sampling (equivalent time) oscilloscopes

Bit error ratio measurements for both electrical and optical links

Extensive coverage on the topic of jitter in high-speed networks

State-of-the-art optical sampling techniques for analysis of 100 Gbit/s + signals

Receiver characterization: clock recovery, phase locked loops, jitter tolerance and transfer functions, sensitivity testing, and stressed-waveform receiver testing

Channel and system characterization: TDR/T and frequency domain-based alternatives

Testing and measuring PC architecture communication links: PCIexpress, SATA, and FB DIMM

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About the Author:

Dennis Derickson is an assistant professor at California Polytechnic State University. He spent eighteen years as member of technical staff and project manager at Hewlett-Packard and Agilent Technologies before serving as applications engineering manager for Cierra Photonics. He has authored or coauthored fifty publications in high-speed communications and is the editor of Fiber Optic Test and Measurement (Prentice Hall, 1998). Dennis has a Ph.D. from the University of California, Santa Barbara.

Marcus M�ller is an R&D lead engineer with Agilent Technologies' High-Speed Digital Test segment in Boeblingen, Germany. He specializes in bit error ratio and jitter analysis of high-speed links, and has contributed to new methods for total jitter measurement at low bit error ratios, and jitter tolerance test. Marcus received his M.Sc. degree from Stuttgart University, Germany, in 1999.

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