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Advances in Imaging and Electron Physics: Part B: 173: Volume 173 - Hardcover

 
9780123969699: Advances in Imaging and Electron Physics: Part B: 173: Volume 173
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This special volume of Advances in Imaging and Electron Physics details the current theory, experiments, and applications of neutron and x-ray optics and microscopy for an international readership across varying backgrounds and disciplines. Edited by Dr. Ted Cremer, these volumes attempt to provide rapid assimilation of the presented topics that include neutron and x-ray scatter, refraction, diffraction, and reflection and their potential application.



  • Contributions from leading authorities
  • Informs and updates on all the latest developments in the field

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Advances in Imaging and Electron Physics features cutting-edge articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains

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  • PublisherAcademic Press
  • Publication date2012
  • ISBN 10 0123969697
  • ISBN 13 9780123969699
  • BindingHardcover
  • Number of pages360

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