Advances in Imaging and Electron Physics, Volume 159: Cold Field Emission and the Scanning Transmission Electron Microscope

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9780123749864: Advances in Imaging and Electron Physics, Volume 159: Cold Field Emission and the Scanning Transmission Electron Microscope

"Advances in Imaging and Electron Physics" merges two long-running serials - "Advances in Electronics and Electron Physics" and "Advances in Optical and Electron Microscopy". This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains. This particular volume presents several timely articles on the scanning transmission electron microscope. Updated with contributions from leading international scholars and industry experts, it discusses hot topic areas and presents current and future research trends. It also provides an invaluable reference and guide for physicists, engineers and mathematicians.

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About the Author:

Peter Hawkes obtained his M.A. and Ph.D (and later, Sc.D.) from the university of Cambridge, where he subsequently held Fellowships of Peterhouse and of Churchill College. From 1959 - 1975, he worked in the electron microscope section of the Cavendish laboratory in Cambridge, after which he joined the CNRS Laboratory of Electron Optics in Toulouse, of which he was Director in 1987. He was Founder-President of the European Microscopy Society and is a Fellow of the Optical Society of America. He is a member of the editorial boards of several microscopy journals.

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Book Description Elsevier Science Publishing Co Inc, United States, 2009. Hardback. Book Condition: New. 231 x 160 mm. Language: English . Brand New Book. Advances in Imaging and Electron Physics merges two long-running serials - Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy . This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains. This particular volume presents several timely articles on the scanning transmission electron microscope. Updated with contributions from leading international scholars and industry experts, it discusses hot topic areas and presents current and future research trends. It also provides an invaluable reference and guide for physicists, engineers and mathematicians. Bookseller Inventory # AA59780123749864

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Published by Elsevier Science Publishing Co Inc, United States (2009)
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Book Description Elsevier Science Publishing Co Inc, United States, 2009. Hardback. Book Condition: New. 231 x 160 mm. Language: English . Brand New Book. Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains. This particular volume presents several timely articles on the scanning transmission electron microscope. Bookseller Inventory # AA59780123749864

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