Architecture Design for Soft Errors - Hardcover

Mukherjee, Shubu

Hardcover

ISBN 10: 0123695295 ISBN 13: 9780123695291

Publisher: Morgan Kaufmann, 2008

Synopsis

Architecture Design for Soft Errors provides a comprehensive description of the architectural techniques to tackle the soft error problem. It covers the new methodologies for quantitative analysis of soft errors as well as novel, cost-effective architectural techniques to mitigate them.

To provide readers with a better grasp of the broader problem definition and solution space, this book also delves into the physics of soft errors and reviews current circuit and software mitigation techniques. There are a number of different ways this book can be read or used in a course: as a complete course on architecture design for soft errors covering the entire book; a short course on architecture design for soft errors; and as a reference book on classical fault-tolerant machines.

This book is recommended for practitioners in semi-conductor industry, researchers and developers in computer architecture, advanced graduate seminar courses on soft errors, and (iv) as a reference book for undergraduate courses in computer architecture.

• Helps readers build-in fault tolerance to the billions of microchips produced each year, all of which are subject to soft errors
• Shows readers how to quantify their soft error reliability
• Provides state-of-the-art techniques to protect against soft errors

About this title

Review

"Dr. Shubu Mukherjee's book is a welcome surprise: books by architecture leaders in major companies are few and far between. Written from the viewpoint of a working engineer, the book describes sources of soft errors and solutions involving device, logic, and architecture design to reduce the effects of soft errors." --Max Baron, Microprocessor Report, May 27, 2008

Synopsis

This book provides a comprehensive description of the architectural techniques to tackle the soft error problem. It covers the new methodologies for quantitative analysis of soft errors as well as novel, cost-effective architectural techniques to mitigate them. To provide readers with a better grasp of the broader problem definition and solution space, this book also delves into the physics of soft errors and reviews current circuit and software mitigation techniques. It provides the methodologies necessary to quantify the effect of radiation-induced soft errors as well as state-of-the-art techniques to protect against them.

Edition details

• Publisher: Morgan Kaufmann
• Publication date: 2008
• Language: English
• ISBN 10: 0123695295
• ISBN 13: 9780123695291
• Binding: Hardcover
• Edition number: 1
• Number of pages: 425